Measuring temporal speckle correlations at ultrafast x-ray sources

Gutt, Christian; Stadler, Lorenz-M.; Duri, Agnès; Autenrieth, Tina; Leupold, O.; Chushkin, Yuriy; Grübel, G.

doi:10.1364/oe.17.000055

Cited by 83 publications

(75 citation statements)

References 6 publications

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“…For XPCS, two methods using XFEL are proposed: ''sequential technique'' and ''split-pulse technique''. [70][71][72][73] The sequential technique is basically same as a conventional XPCS, in which a sequence of speckle patterns obtained from each single shot is collected and autocorrelation functions are obtained. Relatively slow dynamics (less than rate of pulses) is measured by the sequential technique.…”

Section: Perspective Of Xpcsmentioning

confidence: 99%

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

et al. 2013

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In the present review, we focus on the characterization of polymer brushes by quantum beam, which is regarded as a promising probe of surface and interface analysis. The polymer brushes were prepared on various shapes of surface, and proved to be benefit to various applications. Among them, the polymer brushes grafted on sphere nanoparticles and flat substrates are investigated as representative cases. The static structure of polymer brushes, especially the chain dimension of polymer brushes grafted on nanoparticles and a flat substrate, have been studied by small angle X-ray scattering (SAXS) and neutron reflectivity (NR), respectively. The microscopic dynamical properties of polymer brushes are also expected to be revealed by quantum beam. X-ray photon correlation spectroscopy (XPCS), a technique using a coherent X-ray, is one of the promising methods for microscopically understanding of dynamical properties of polymer brushes. Some of our recent studies about dynamical behavior of polymer brush immobilized nanoparticle by XPCS are also presented.

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Section: Perspective Of Xpcsmentioning

confidence: 99%

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

et al. 2013

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“…Wochner et al 27 have used the diagonal 2-point CC, derived from synchrotron X-ray coherent diffraction data from highly concentrated suspensions of PMMA nanospheres, to identify the preferential symmetry of 3D clusters 25 that form temporarily within the sample. Regarding possible future investigations on 3D structural features of macromolecules or other particles in solution, which exploit the brilliance of XFEL radiation sources, it appears that applying the CC method in the spirit of its original formulation 13 is a suitable approach; dynamical information may be accessed through the straightforward generalization of the CC analysis to laser pump/X-ray probe scattering images, or even to scattering data obtained with X-ray split-and-delay data 28,29 . The present 2D demonstration experiment and its discussion have direct relevance to the 3D case, regarding the effects of interparticle interference and of the unavoidably non-uniform beam intensity profile, as well as the independence of the signal-to-noise from the average number of scattering particles.…”

Section: Discussionmentioning

confidence: 99%

Two-dimensional structure from random multiparticle X-ray scattering images using cross-correlations

et al. 2013

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Knowledge of the structure of biological macromolecules, especially in their native environment, is crucial because of the close structure-function relationship. X-ray small-angle scattering is used to determine the shape of particles in solution, but the achievable resolution is limited owing to averaging over particle orientations. In 1977, Kam proposed to obtain additional structural information from the cross-correlation of the scattering intensities. Here we develop the method in two dimensions, and give a procedure by which the single-particle diffraction pattern is extracted in a model-independent way from the correlations. We demonstrate its application to a large set of synchrotron X-ray scattering images on ensembles of identical, randomly oriented particles of 350 or 200 nm in size. The obtained 15 nm resolution in the reconstructed shape is independent of the number of scatterers. The results are discussed in view of proposed 'snapshot' scattering by molecules in the liquid phase at X-ray free-electron lasers.

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“…The first order diffracted beam from the grating is sent to a bent crystal for energy dispersion under Bragg condition [54]. The 10 µm thick bent silicon Si crystals have (110) or (111) orientations and are mounted with fixed bending radii of 75 mm, 100 mm or 150 mm. Two detectors are available for data acquisition: an optical camera for full transverse 2D imaging at low repetition rate, and a modified Gotthard-II 1D strip detector for fast data acquisition at 4.5 MHz.…”

Section: The Hirex Spectrometermentioning

confidence: 99%

Photon Beam Transport and Scientific Instruments at the European XFEL

et al. 2017

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Featured Application: This article describes the layout of the European XFEL, a soft and hard X-ray free-electron laser user facility starting operation in 2017. Emphasis is put on the photon beam systems, scientific applications and the instrumentation of the scientific instruments of the European XFEL.Abstract: European XFEL is a free-electron laser (FEL) user facility providing soft and hard X-ray FEL radiation to initially six scientific instruments. Starting user operation in fall 2017 European XFEL will provide new research opportunities to users from science domains as diverse as physics, chemistry, geo-and planetary sciences, materials sciences or biology. The unique feature of European XFEL is the provision of high average brilliance in the soft and hard X-ray regime, combined with the pulse properties of FEL radiation of extreme peak intensities, femtosecond pulse duration and high degree of coherence. The high average brilliance is achieved through acceleration of up to 27,000 electron bunches per second by the super-conducting electron accelerator. Enabling the usage of this high average brilliance in user experiments is one of the major instrumentation drivers for European XFEL. The radiation generated by three FEL sources is distributed via long beam transport systems to the experiment hall where the scientific instruments are located side-by-side. The X-ray beam transport systems have been optimized to maintain the unique features of the FEL radiation which will be monitored using build-in photon diagnostics. The six scientific instruments are optimized for specific applications using soft or hard X-ray techniques and include integrated lasers, dedicated sample environment, large area high frame rate detector(s) and computing systems capable of processing large quantities of data.

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Measuring temporal speckle correlations at ultrafast x-ray sources

Cited by 83 publications

References 6 publications

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

Two-dimensional structure from random multiparticle X-ray scattering images using cross-correlations

Photon Beam Transport and Scientific Instruments at the European XFEL

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