2018 Portland International Conference on Management of Engineering and Technology (PICMET) 2018
DOI: 10.23919/picmet.2018.8481825
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Measuring Technology Diffusion for the Case of RFID Technology: A Comparison between tf-lag-idf and Topic Modeling

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“…This method is widely used in recent literature [e.g. [68][69][70][71][72] and relies on the co-occurrence of observed words in different patents to derive two probability distributions: the distribution of topics per patent and the distribution of words across topics [73]. The distribution of topics per patent is exploited in this study, as it allows the transformation of each patent into a 𝑇-dimensional numerical vector.…”
Section: Model For the Assessment Of Standard-essentialitymentioning
confidence: 99%
“…This method is widely used in recent literature [e.g. [68][69][70][71][72] and relies on the co-occurrence of observed words in different patents to derive two probability distributions: the distribution of topics per patent and the distribution of words across topics [73]. The distribution of topics per patent is exploited in this study, as it allows the transformation of each patent into a 𝑇-dimensional numerical vector.…”
Section: Model For the Assessment Of Standard-essentialitymentioning
confidence: 99%