Measuring material thickness changes through tri-aperture digital speckle pattern interferometry

Barrera, Estiven S.; Ealo, Joao L.

doi:10.1117/1.oe.62.1.014108

Cited by 3 publications

(4 citation statements)

References 19 publications

(42 reference statements)

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“…A similar configuration can be used to make a DSPI measurement, 8,12 as shown in Fig 5 . In this case, only a reference speckle is necessary for the front of one of the apertures. To do that grounded glass is used and a deflected beam of the source is used to illuminate it.…”

Section: Double Aperturementioning

confidence: 99%

“…The use of multiple apertures in optical systems can produce interference patterns that are useful for various applications. 12 Instead of using two apertures, three or more can be employed to achieve the same effect. However, in such a multi-aperture system, multiple wavefronts interfere with each other, leading to the need for proper adaptation of the aperture locations to avoid overlaps of results and to potentially separate information in the Fourier domain.…”

Section: Multiple Aperturementioning

confidence: 99%

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Speckle interferometry single-shot applications with multiple carrier-fringe information

Barrera

2023

Dimensional Optical Metrology and Inspection for Practical Applications XII

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The need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle.

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Section: Double Aperturementioning

confidence: 99%

Section: Multiple Aperturementioning

confidence: 99%

Speckle interferometry single-shot applications with multiple carrier-fringe information

Barrera

2023

Dimensional Optical Metrology and Inspection for Practical Applications XII

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“…Right: effect of interference due to the difference in optical paths, caused by the distance between apertures and the distance to the camera sensor. 10 When a coherent light passes through both apertures, the images of the two apertures are superimposed and, due to the path differences, a periodic structure is produced within each speckle image. The interference lines are perpendicular to the orientation of the apertures.…”

Section: Double Aperture Principlementioning

confidence: 99%

“…D1-D3Diffusers. The interferometer arm, with the dashed line, is oriented in the vertical direction 10.…”

mentioning

confidence: 99%

Measuring material thickness variations through tri-aperture DSPI

Barrera

Ealo

2023

Dimensional Optical Metrology and Inspection for Practical Applications XII

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A configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, interferometry configurations verified that the simultaneous and instantaneous visualization of two opposite faces of a surface is possible. In addition, the combination of the simultaneous results obtained from both sides of the material makes it possible to determine displacements with greater sensitivity or to identify changes in their thickness. The validation and demonstrative tests were carried out with a 1-mm thick aluminum plate with a 5-mm diameter through hole coated. Thickness changes until 2 μm was measured.

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Dynamic three-dimensional deformation measurement by polarization-multiplexing of full complex amplitude

Du,

Li,

Fan

et al. 2024

Opt. Express

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This paper provides an extensive discussion of a complex amplitude-based dynamic three-dimensional deformation measurement method, in which the phase and amplitude of the speckle field are used for out-of-plane and in-plane deformation calculation respectively. By determining the optimal polarization states of the speckle field and reference field from the comprehensive analysis of measurement mathematical model in the principle of polarization multiplexing, the 3-step phase-shifting interferograms and one speckle gram can be directly recorded by a polarization camera in a single shot. The out-of-plane deformation would be recovered from the subtraction of speckle phases that are demodulated by a special least square algorithm; speckle gram with improved quality is offered for correlation computation to obtain in-plane deformation. The advancement and significance of the optimized strategy are intuitively demonstrated by comparing the measurement accuracy under different combinations of polarization states. Finally, the dynamic thermal deformation experiment reveals the potential in practical real-time applications.

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Measuring material thickness changes through tri-aperture digital speckle pattern interferometry

Cited by 3 publications

References 19 publications

Speckle interferometry single-shot applications with multiple carrier-fringe information

Speckle interferometry single-shot applications with multiple carrier-fringe information

Measuring material thickness variations through tri-aperture DSPI

Dynamic three-dimensional deformation measurement by polarization-multiplexing of full complex amplitude

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