2005
DOI: 10.1016/j.conbuildmat.2005.06.005
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Measuring layer thicknesses with GPR – Theory to practice

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Cited by 216 publications
(98 citation statements)
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“…(2), derived from the Fresnel reflection coefficients [1], ε r1 and ε r2 are the respective relative dielectric permittivities of the two materials and 1 is the inclination of the incident ray ( Fig. 2 (a)).…”
Section: 2mentioning
confidence: 99%
See 1 more Smart Citation
“…(2), derived from the Fresnel reflection coefficients [1], ε r1 and ε r2 are the respective relative dielectric permittivities of the two materials and 1 is the inclination of the incident ray ( Fig. 2 (a)).…”
Section: 2mentioning
confidence: 99%
“…Among all the non-destructive methods, the Ground Penetrating Radar (GPR) is well adapted to inspect multilayer structures because only a percentage of the energy is reflected at every interface. An inspection can thus reveal the thickness and electromagnetic properties of two layers or more, if the conditions are favorable [1].…”
Section: Introductionmentioning
confidence: 99%
“…Different equations are utilized to approximate this zone [4]. Vertical resolution is often considered as ¼ of the wavelength [5][6], but in field measurements it is sometimes considered as 1/2 of the wavelength [7] [8]. Spatial resolution is largely dependent on the beam of the antenna because the footprint at different depths depends on the energy cone transmitted.…”
Section: Laboratory Datamentioning
confidence: 99%
“…Full waveform inversion methods can give good estimation of thin layers parameters [1][2][3], but they also require an antenna calibration, as well as a large computing cost. The faster alternatives to these methods exploit the reflection coefficient of the layer to determine its properties [4][5][6]. The reflection coefficient, R, is the proportion of the incident wave reflected by the layer.…”
Section: Introductionmentioning
confidence: 99%