2011
DOI: 10.1016/j.susc.2011.01.035
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Measuring concentration depth profiles at liquid surfaces: Comparing angle resolved X-ray photoelectron spectroscopy and neutral impact collision scattering spectroscopy

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Cited by 21 publications
(22 citation statements)
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“…As a result, the surfactant surface/bulk concentration gradients obtained were much less pronounced than those given by the classical equation, thus by partitioning models. Such small gradients have been confirmed experimentally by ion scattering32 and angle resolved X-ray photoelectron3334 spectroscopies, which have observed surface/bulk concentration ratios between 2 and 8. These ratios will be compared with those predicted by partitioning models in the Discussion section.…”
Section: Resultsmentioning
confidence: 64%
See 1 more Smart Citation
“…As a result, the surfactant surface/bulk concentration gradients obtained were much less pronounced than those given by the classical equation, thus by partitioning models. Such small gradients have been confirmed experimentally by ion scattering32 and angle resolved X-ray photoelectron3334 spectroscopies, which have observed surface/bulk concentration ratios between 2 and 8. These ratios will be compared with those predicted by partitioning models in the Discussion section.…”
Section: Resultsmentioning
confidence: 64%
“…For a particle with a radius of 300 nm and a surface layer of 3 nm, for instance, a number ratio of 11 corresponds to a concentration ratio of 352. The concentration ratios of 2–8 measured experimentally for surfactants 32 33 34 thus indicate that those calculated by the partitioning models are overestimated by a factor 100 in average (44–176), and the corresponding values of n b are underestimated by the same factor. The Raoult’s term should thus be also underestimated by about 100, as it is proportional to n b , which should substantially underestimate the cloud-forming efficiency of surfactants.…”
Section: Discussionmentioning
confidence: 84%
“…ARXPS can be used to determine the layer thicknesses. 37 Eschen et al have described the procedure in detail. 38 The concentration depth profile of aTiO 2 -Cr 2 O 3 is shown in Figure S9.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…In (a) the concentration depth profiles of Bu 4 P + measured with NICISS and ARXPS and in (b) the concentration depth profiles of Br − are compared . For comparison the Bu 4 N + concentration depth profile measured by Eschen et al.…”
Section: Concentration Depth Profilesmentioning
confidence: 99%