2014
DOI: 10.1103/physrevd.90.122001
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Measurements of temporal and spatial variation of surface potential using a torsion pendulum and a scanning conducting probe

Abstract: An electrostatic-controlled torsion pendulum combined with a scanning conducting probe is used to measure the temporal and spatial variations of the surface potential on test mass. The apparatus can work in static and scanning modes. Temporal variation of the surface potential can be measured with the static mode, and its voltage variation with a level of 15 μV=Hz 1=2 at 0.03 Hz has been achieved for a 5 × 5 mm 2 area. The spatial distribution of the surface potential can be measured with the scanning mode, an… Show more

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Cited by 24 publications
(14 citation statements)
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References 21 publications
(26 reference statements)
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“…Forces acting on the TM surface include other spontaneous outgassing and/or virtual leak pressure effects, from the many cables and other surfaces inside the GRS, as well as electrostatic noise from fluctuating small-scale surface patch potentials interacting with their own steady field values. Regarding the electrostatic noise, while the interaction of the spatially averaged stray fields and the TM charge is well measured in flight [15], random field fluctuations on smaller scales cannot be excluded, at the levels of the remaining noise, from either flight measurements or ground studies [16][17][18]. Pressure-related effects can be addressed by direct pressure measurements in representative GRS hardware, while electrostatic force noise and other short range forces can be studied on the ground in torsion pendulum tests with much smaller gaps between the TM and surrounding conducting surfaces.…”
mentioning
confidence: 99%
“…Forces acting on the TM surface include other spontaneous outgassing and/or virtual leak pressure effects, from the many cables and other surfaces inside the GRS, as well as electrostatic noise from fluctuating small-scale surface patch potentials interacting with their own steady field values. Regarding the electrostatic noise, while the interaction of the spatially averaged stray fields and the TM charge is well measured in flight [15], random field fluctuations on smaller scales cannot be excluded, at the levels of the remaining noise, from either flight measurements or ground studies [16][17][18]. Pressure-related effects can be addressed by direct pressure measurements in representative GRS hardware, while electrostatic force noise and other short range forces can be studied on the ground in torsion pendulum tests with much smaller gaps between the TM and surrounding conducting surfaces.…”
mentioning
confidence: 99%
“…The schematic of this novel scheme is shown in Figure 13 a; this scheme combines the scanning capability of the Kelvin probe and the high precision of the torsion pendulum. Temporal variation of the surface potential can be measured at a level of 15 μV/Hz 1/2 at 0.03 Hz, and the surface-potential distribution can be obtained at a level of 330 μV at a 0.125-mm spatial resolution, as shown in Figure 13 b [ 57 ].…”
Section: Progress Of Electrostatic Accelerometer Development At Humentioning
confidence: 99%
“…The surface of an ideal metallic conductor is often assumed to be an equipotential. However, it would not be true for real metallic surface according to the measurements of surface potential [1][2][3][4][5][6][7][8][9][10], for example, Camp et al measured surface potential variations of 70 mV over scales of 10 mm in a mental sample [2]. Furthermore, fluctuations in the electric potential are also be observed by different experiments [4,9,10].…”
Section: Introductionmentioning
confidence: 99%
“…Generally, the methods to study the origin and influence of patch potential includes the experimental measurement and the theoretical modeling. For the experimental measurement of the patch effect, the Kelvin probe and the torsion pendulum methods are often used [4][5][6][7][8][9]32]. The Kelvin probe force microscopy (KPFM) can measure the potentials over the testing region with an extremely high spatial resolution of about several nanometers.…”
Section: Introductionmentioning
confidence: 99%
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