2013
DOI: 10.1109/ted.2013.2282709
|View full text |Cite
|
Sign up to set email alerts
|

Measurements of Silicon Photomultipliers Responsivity in Continuous Wave Regime

Abstract: We report on the electrical and optical characterization,\ud in continuous wave regime, of a novel class of silicon\ud photomultipliers fabricated in standard planar technology on a\ud silicon p-type substrate. Responsivity measurements, performed\ud with an incident optical power down to tenths of picowatts, at\ud different reverse bias voltages and on a broad (340–820 nm)\ud spectrum, will be shown and discussed. The device temperature\ud was monitored, allowing us to give a physical interpretation of the\ud… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
14
0

Year Published

2014
2014
2019
2019

Publication Types

Select...
3
2
2
1

Relationship

3
5

Authors

Journals

citations
Cited by 25 publications
(15 citation statements)
references
References 35 publications
1
14
0
Order By: Relevance
“…As stated above, another cause of noise in SiPMs is the thermal noise due to the thermal generation of carriers through recombination-generation centers or to the bulk diffusion of minority carriers from the quasi-neutral region. In the absence of light, the electrical effect of these mechanisms is referred to as dark current [1], [5], [11]. The experimental setup, employed for our continuous wave SNR measurements, is shown in Fig.…”
Section: Experimental Results and Data Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…As stated above, another cause of noise in SiPMs is the thermal noise due to the thermal generation of carriers through recombination-generation centers or to the bulk diffusion of minority carriers from the quasi-neutral region. In the absence of light, the electrical effect of these mechanisms is referred to as dark current [1], [5], [11]. The experimental setup, employed for our continuous wave SNR measurements, is shown in Fig.…”
Section: Experimental Results and Data Analysismentioning
confidence: 99%
“…Currently, SiPMs are mainly employed for single photon counting, in conjunction with pulsed lasers [1]- [4] and, therefore, the dark noise is the main noise source. However, SiPMs have been used in the CW regime in several applications [5], [6], and, for this reason, it is important to investigate the effect of SNR in this operative conditions [7]. In the CW regime, at very low optical intensities, the shot noise component, arising from photon statistical fluctuations and thermal-generation processes, must be taken into account [8], [9].…”
Section: Introductionmentioning
confidence: 99%
“…The series of each SPAD and its quenching resistor are connected in parallel. Details about the fabrication are extensively explained in [33].…”
Section: Description Of the Devicementioning
confidence: 99%
“…However, SiPMs can be used in the continuous wave (CW) regime in several applications, such as very low power measurements (less than 1 pW) [23], as disposable sensors in immunoassay tests [24] and, above all, in CW near-infrared spectroscopy systems [25]- [32]. For this reason, it is important to investigate the effect of SNR in these operative conditions [33]- [35]. In the CW regime, at very low optical intensities, the shot noise component, arising from photon statistical fluctuations, must be taken into account [27], [36], [37].…”
Section: Introductionmentioning
confidence: 99%
“…Silicon Photomultipliers (SiPM) have been then adopted since they fulfill these fierce requirements [11][12][13][14] and the rest of this paper will describe the system architecture that has been realized and the experimental results that evaluate the obtained performances in term of fidelity on the detecting action and the related computational loads.…”
Section: Introductionmentioning
confidence: 99%