1999
DOI: 10.1016/s0370-2693(99)00244-0
|View full text |Cite
|
Sign up to set email alerts
|

Measurements of R=σL/σT for 0.03<x<0.1 and fit to world data

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

7
59
0

Year Published

2005
2005
2018
2018

Publication Types

Select...
3
3

Relationship

1
5

Authors

Journals

citations
Cited by 128 publications
(66 citation statements)
references
References 15 publications
7
59
0
Order By: Relevance
“…The results with the parametrization of Ref. [20] are very similar, and are consistent within the quoted uncertainties.…”
Section: Pvdis On the Protonsupporting
confidence: 85%
See 2 more Smart Citations
“…The results with the parametrization of Ref. [20] are very similar, and are consistent within the quoted uncertainties.…”
Section: Pvdis On the Protonsupporting
confidence: 85%
“…While data and phenomenological parametrizations are available for R γ [19][20][21], currently no empirical information exists on R γZ . In our numerical estimates below, we shall consider a range of possible behaviors for R γZ and examine its effect on A PV .…”
Section: Electroweak Structure Functionsmentioning
confidence: 99%
See 1 more Smart Citation
“…The structure functions F p 2 and F d 2 are finally derived from the Born cross sections through eq. (2.6) using the parameterization R = R 1998 [32]. Two more corrections related to detector geometry and alignment are discussed in sections 4.7 and 4.8.…”
Section: Discussionmentioning
confidence: 99%
“…The overall normalization uncertainty is 7.6%. The structure function F p 2 is derived using the parameterization R = R 1998 [32].…”
Section: Jhep05(2011)126mentioning
confidence: 99%