2010
DOI: 10.1002/ctpp.201010138
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Measurements of Plasma Properties Using Fast Sweep Langmuir Probes in Unmagnetized Weakly Ionized Plasmas

Abstract: The performances of a simple circuit for fast sweep measurements using collecting and emissive Langmuir probes are evaluated. The probes are biased by means of a time dependent ramp voltage signal with a variable pulse frequency and the current voltage curves are measured along the increasing flange of this sawtooth voltage. The response of this fast probe polarization circuit was verified under actual experimental conditions by measuring the properties of a stationary Maxwellian plasma produced by means of a … Show more

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Cited by 15 publications
(25 citation statements)
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“…13. This equipment bias the probes with voltage ramp signals of frequencies over 2.0 KHz added to a time independent DC polarization voltage.…”
Section: Langmuir Probe Diagnosticsmentioning
confidence: 99%
“…13. This equipment bias the probes with voltage ramp signals of frequencies over 2.0 KHz added to a time independent DC polarization voltage.…”
Section: Langmuir Probe Diagnosticsmentioning
confidence: 99%
“…[9]. The emissive probes were made of a thin tungsten wire loop of 0.08 mm in diameter and variable lengths between 4.3 and 8.3 mm.…”
Section: Methodsmentioning
confidence: 99%
“…1. These I-V characteristic curves for both collecting I P (V P ) and emissive I P (T P ,V P ) probes were obtained by means of a fast sweep biasing circuit discussed in [13]. Briefly, the probes are biased with voltage ramp signals with a repetition pulse over 2.0 kHz, and the values of the probe current and bias voltage were later digitized by means of a Yokogawa DL9140 digital oscilloscope for the subsequent analysis.…”
Section: Methodsmentioning
confidence: 99%