2014
DOI: 10.1103/physrevd.89.092004
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Measurements of mechanical thermal noise and energy dissipation in optical dielectric coatings

Abstract: In recent years an increasing number of devices and experiments are shown to be limited by mechanical thermal noise. In particular sub-Hertz laser frequency stabilization and gravitational wave detectors, that are able to measure fluctuations of 10−18 m/ √ Hz or less, are being limited by thermal noise in the dielectric coatings deposited on mirrors. In this paper we present a new measurement of thermal noise in low absorption dielectric coatings deposited on micro-cantilevers and we compare it with the result… Show more

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Cited by 31 publications
(34 citation statements)
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“…The variation of loss observed from mode to mode is larger than the statistical uncertainty. On the contrary, from other measurements [17], we know that the expected loss of sputtered tantala is constant with frequency: that means other systematic effects related to the presence of coatings have to be considered in order to justify the observed variation of loss. The loss decreases with the increase of annealing temperature until the material becomes polycrystalline above 600…”
Section: Comments and Conclusionmentioning
confidence: 77%
See 1 more Smart Citation
“…The variation of loss observed from mode to mode is larger than the statistical uncertainty. On the contrary, from other measurements [17], we know that the expected loss of sputtered tantala is constant with frequency: that means other systematic effects related to the presence of coatings have to be considered in order to justify the observed variation of loss. The loss decreases with the increase of annealing temperature until the material becomes polycrystalline above 600…”
Section: Comments and Conclusionmentioning
confidence: 77%
“…(4)), a tantala Young's modulus of about 110 GPa has been worked out. The difference may be explained by a different choice of deposition parameters between our samples and those of reference [23] from where the tantala Young's modulus used in the calculations and FEA [17] has been taken. Fig.…”
Section: Comments and Conclusionmentioning
confidence: 99%
“…where φ i,tot is the loss angle of coated disk and φ i,s is the loss angle of the substrate. D i is the so-called dilution factor which can be related to f i,s , f i,tot , m s and m tot [8], that are the frequencies and the mass of the sample before and after the coating deposition, respectively. of doping.…”
mentioning
confidence: 99%
“…shape, and can be written as a function of the mode frequency and the mass of the sample before and after the coating deposition ( f s_i , f i , m s and m, respectively) [19],…”
Section: Measurementmentioning
confidence: 99%