2019
DOI: 10.1002/xrs.3038
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Measurements of L‐shell X‐ray emission lines of neonlike europium on an electron beam ion trap

Abstract: We report a measurement of the two x-ray transitions that proceed from the (1s 2 2s 2 2p 5 1/2 3d 3/2 ) J=1 and (1s 2 2s 1/2 2p 6 3p 1/2 ) J=1 upper levels to the (1s 2 2s 2 2p 6 ) J=0 ground level in neonlike Eu 53+ (Z = 63), i.e. near the previously documented avoided crossing of the two upper levels at Z = 68. The measurement was carried out using the calorimeter spectrometer on the Livermore EBIT-I electron beam ion trap. It affirms the trends set by the neighboring neonlike ions both in terms of the relat… Show more

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Cited by 3 publications
(2 citation statements)
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“…The spectra analyzed in this paper were obtained using beam energies of around 10 350 eV and currents of 128-154 mA. This energy was selected to maximize the presence of neonlike ions, which were the focus of a larger study conducted by our group [43,44]. However, for the current measurement we purposefully increased the presence of low charge states by increasing the injection pressure and shortening the cycle time.…”
Section: Methodsmentioning
confidence: 99%
“…The spectra analyzed in this paper were obtained using beam energies of around 10 350 eV and currents of 128-154 mA. This energy was selected to maximize the presence of neonlike ions, which were the focus of a larger study conducted by our group [43,44]. However, for the current measurement we purposefully increased the presence of low charge states by increasing the injection pressure and shortening the cycle time.…”
Section: Methodsmentioning
confidence: 99%
“…[ 8 ] Furthermore, accurate X‐ray diffraction has the potential to give insights into new physics by testing fundamental constants in quantum electrodynamics. [ 9–12 ] Needless to say, significant improvements to determine photon energies in the X‐ray regime will improve the quality of data and will further research in all these fields. Whilst conventional crystallography with wide angle detectors will usually not be aperture‐limited except at the source, most areas of X‐ray diffraction and X‐ray spectroscopy are aperture‐limited at source and detector so that the optics of spectral profiles are critical to insight.…”
Section: Introductionmentioning
confidence: 99%