Measurements of inner-shell characteristic X-ray yields of thick W, Mo and Zr targets by low-energy electron impact and comparison with Monte Carlo simulations

Li, X.L.; Zhao, Jianling; Tian, Lixia; An, Zhu; Zhu, J. J.; Liu, M.T.

doi:10.1016/j.nimb.2014.04.017

Cited by 11 publications

(3 citation statements)

References 38 publications

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“…Bote et al (2008) showed that K and L X-ray yields calculated by using PENELOPE were in reasonably good agreement with experimental measurements taken from the literature. Li et al (2014) and Zhao et al (2015) carried out their own X-ray yield measurements and showed that their experimental data compared favorably, to within ~10%, with the predictions of PENELOPE. More recently, Moy et al (2015) performed new absolute X-ray yield measurements for several high- Z element materials, which were found to agree satisfactorily with the predictions of PENEPMA.…”

Section: Examples Of Applications Of Penepmamentioning

confidence: 97%

PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis

Llovet

Salvat

2017

Microsc Microanal

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The Monte Carlo program PENEPMA performs simulations of X-ray emission from samples bombarded with both electron and photon beams. It is based on the general-purpose Monte Carlo simulation package PENELOPE, an elaborate system for the simulation of coupled electron-photon transport in arbitrary materials, and on the geometry subroutine package PENGEOM, which tracks particles through complex material structures defined by quadric surfaces. After a brief description of the interaction models implemented in the simulation subroutines and of the structure and operation of PENEPMA, we provide an overview of the capabilities of the program along with several examples of its application to the modeling of electron probe microanalysis measurements.

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Section: Examples Of Applications Of Penepmamentioning

confidence: 97%

PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis

Llovet

Salvat

2017

Microsc Microanal

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“…In this paper, the experimental setup is similar to that of Li et al [41] and Zhao et al [42]. In order to obtain more accurate experimental data, the deep Faraday cup was redesigned and its schematic drawing is shown in figure 1.…”

Section: Methodsmentioning

confidence: 99%

Investigations of L-shell x-ray production cross sections of In and Sn by low-energy electron impact

Zhao

Zhu

et al. 2016

J. Phys. B: At. Mol. Opt. Phys.

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Results from the measurements of absolute L-shell x-ray production cross sections of In (Z = 49) and Sn (Z = 50) by the impact of electrons with energies in the range of 6–28 keV are presented. The experimental setup has been improved and thin films with thick aluminum substrates were used as targets in the experiments. The effect of directional and energy spreads of the incident electron beam within the films and the characteristic x-ray enhancement due to backscattered electrons and bremsstrahlung photons generated from the substrates were corrected by means of Monte Carlo simulations. The experimental results of In and Sn elements by electron and positron impacts were compared with the DWBA and PWBA-C-Ex theories. It was shown that the L-shell x-ray production cross sections of In and Sn elements by electron impact measured in this paper were in good agreement with the theoretical predictions within the uncertainties and that the discrepancies existed between the experimental results by positron impact, available in the literature, and the theoretical values. The influence of the atomic relaxation parameters (fluorescence yields and Coster–Kronig coefficients) has also been discussed.

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“…The reliability of PENEPMA and PENELOPE has been assessed by our group as well as by other researchers through systematic comparisons of simulated and experimental X-ray spectra from bulk samples [21][22][23], X-ray yields from bulk samples [24][25][26][27], k-ratios from thin films on substrates [28], and k-ratios from material couples [29,30]. Examples of recent applications of PENEPMA or PENELOPE in EPMA include the study of secondary fluorescence effects in bulk samples and near phase boundaries [31,32], the analysis of inclusions in steel [33], the simulation of energy-dispersive spectra for automated materials identification [34,35], the determination of the detector efficiency for standard-less analysis [36] or the examination of carbon contamination effects in high-resolution EPMA [37].…”

Section: Examples Of the Application Of Penepmamentioning

confidence: 99%

PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA

Llovet

Salvat

2016

IOP Conf. Ser.: Mater. Sci. Eng.

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Abstract. The Monte Carlo programme PENEPMA performs simulations of X-ray emission from samples bombarded with electron beams. It is both based on the general-purpose Monte Carlo simulation package PENELOPE, an elaborate system for the simulation of coupled electron-photon transport in arbitrary materials, and on the geometry subroutine package PENGEOM, which tracks particles through complex material structures defined by quadric surfaces. In this work, we give a brief overview of the capabilities of the latest version of PENEPMA along with several examples of its application to the modelling of electron probe microanalysis measurements.

show abstract

Measurements of inner-shell characteristic X-ray yields of thick W, Mo and Zr targets by low-energy electron impact and comparison with Monte Carlo simulations

Cited by 11 publications

References 38 publications

PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis

PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis

Investigations of L-shell x-ray production cross sections of In and Sn by low-energy electron impact

PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA

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