2013
DOI: 10.2478/jeec-2012-0015
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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Abstract: One of the biggest challenges of communication networks is the video transmission in real time. It requires high demands on the available network capacity and transport mechanisms. Availability of smart mobile devices with batteries, which keep the terminal working for several hours, caused an increased interest in the research of the deployment of video transmission in wireless transmission systems. The presented paper deals with the transmission of video encoded with H.264/AVC (Advanced Video Coding) video c… Show more

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Cited by 17 publications
(15 citation statements)
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“…This configuration consists of four independent electrical terminals where two terminals are used to apply current to the sample, and the other two terminals measure the resulting potential drop across the defined portion of the sample. In the technique of linear four-point probes all measurement tips are placed along a straight line and separated by a constant distance [28]. The Hall effect measurements were conducted in air, at room temperature.…”
Section: Sheet Resistance Measurement Of Pedot:pssmentioning
confidence: 99%
“…This configuration consists of four independent electrical terminals where two terminals are used to apply current to the sample, and the other two terminals measure the resulting potential drop across the defined portion of the sample. In the technique of linear four-point probes all measurement tips are placed along a straight line and separated by a constant distance [28]. The Hall effect measurements were conducted in air, at room temperature.…”
Section: Sheet Resistance Measurement Of Pedot:pssmentioning
confidence: 99%
“…The substrate temperature was maintained at 600 Morphology and structure of prepared samples were characterized by SEM JEOL 7500F and Raman spectroscopy (Renishaw InVia Reflex Raman spectrometer with the excitation wavelength of 325 and 442 nm and ISA Dilor-Jobin Yvon-Spex Labram confocal system with the excitation wavelength of 633 nm). Electrical properties were determined using 4-point resistivity and Hall method measurements described elsewhere [8]. To form ohmic contacts, BDD thin films were contacted with a 10 min vacuum annealed (10 −3 Pa, 425…”
Section: Experimental Partmentioning
confidence: 99%
“…TE yarıiletkenler çok küçük boyutlarda ve benzer görünüme sahip olduklarından, P-N tipinin gözle ve elle belirlenmesi mümkün olamamaktadır. Bu açıdan TE yarıiletken P-N tipinin hızlı ve güvenilir bir şekilde belirlenmesine yönelik yeni sistemlerin geliştirilmesine ihtiyaç duyulmuş ve zaman içerisinde Hot-Probe metodu [1]- [6], Hall-Effect metodu [7], [8], 4-point probe metodu [9], [10] gibi çeşitli metotlar geliştirilmiştir. Bu yöntemler içerisinde Seebeck etkisi prensibine dayanan Hot-Probe metodu, diğer metotlara göre daha pratik, hızlı ve kullanışlıdır [3], [5], [6].…”
Section: Introductionunclassified