1996
DOI: 10.1016/0042-207x(96)00149-2
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Measurement system for low outgassing materials by switching between two pumping paths

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Cited by 17 publications
(11 citation statements)
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“…The distribution of hydrogen atoms around the surface layer was analyzed by a time of flight -secondary ion mass spectrometry (TOF-SIMS). The outgassing rate was estimated by a modified orifice method switching between two pumping paths (SPP) [17]. The detection limit of the system was 7×10 -13 Pams -1 since the upstream and downstream pressures attained to 10 -9 Pa and below, the orifice conductance C 0 was set to 6.1x10 -3 m 3 s -1 and the sample area was 8.9×10 -1 m 2 [13].…”
Section: Surface Finishingmentioning
confidence: 99%
“…The distribution of hydrogen atoms around the surface layer was analyzed by a time of flight -secondary ion mass spectrometry (TOF-SIMS). The outgassing rate was estimated by a modified orifice method switching between two pumping paths (SPP) [17]. The detection limit of the system was 7×10 -13 Pams -1 since the upstream and downstream pressures attained to 10 -9 Pa and below, the orifice conductance C 0 was set to 6.1x10 -3 m 3 s -1 and the sample area was 8.9×10 -1 m 2 [13].…”
Section: Surface Finishingmentioning
confidence: 99%
“…The two-path method is described in Ref. 7. It also has the advantage that the x-ray limit and outgassing rate of the gauge are canceled out by the difference method used.…”
Section: Two-path Methodsmentioning
confidence: 99%
“…The two-path method can be used to measure very low outgassing rates, for example, with an orifice conductance of 6ϫ10 Ϫ3 m 3 s Ϫ1 the lowest outgassing rate measurable by the two-path method has been shown to be less than 10 Ϫ11 Pa m s Ϫ1 ; this is a factor of about 100 less than that of the conventional throughput method. 7…”
Section: Outgassing Ratementioning
confidence: 99%
“…where M is the AMU of the gas, T is the temperature in K, P " is the pressure in the main chamber in Torr, and A is the area of the main chamber in cm. Modulating the conductance from the sample chamber to the pumping chamber has been used to compensate for chamber wall effects [4]. From Moraw [5] the sticking fraction, s, can be determined by changing the conductance between two known conductances, G 1 and G 2 , measuring the pressure on the vessel side where the sample is located, p "1 and p "2 , and on the pumping side p p1 and p p2 for the two cases.…”
Section: Rga Analysismentioning
confidence: 99%