2008
DOI: 10.1088/1742-6596/133/1/012017
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of voltage and current in continuous and pulsed rf and dc glow discharges

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
24
0

Year Published

2010
2010
2020
2020

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 27 publications
(25 citation statements)
references
References 23 publications
0
24
0
Order By: Relevance
“…The plasma behaves electrically rather similar to a resistance [11]. The work function which has inverse relation with secondary electron coefficient.…”
Section: Resultsmentioning
confidence: 99%
“…The plasma behaves electrically rather similar to a resistance [11]. The work function which has inverse relation with secondary electron coefficient.…”
Section: Resultsmentioning
confidence: 99%
“…Apparently, the THz pulse may relate to THz radiation, the THz radiation power may be approximately estimated as 10 −21 W by using P=40π2I021true/λ2 , here, I 0 ≈ 10 −7 A is the amplitude of the current, λ ≈ 10 −4 m is the wavelength of the THz radiation, and l ≈ 1 nm is taken as the length of the BGF. On the one hand, it is noted that the current measurement is an integral in time on the microsecond scale , the proposed current oscillation perhaps can not be detected directly. Detecting the THz radiation may be used to indirectly test the existence of the THz pulse.…”
Section: Numerical Calculations and Discussionmentioning
confidence: 94%
“…papers have been published on the analytical applications of the pulsed GD-OES. 6,7) In the depth profiling of GD-OES, not only the interface resolution but the information depth should be taken into consideration. The interface resolution would be determined principally by the shape of the sputter crater left when the sputtering passes through two different layers in the sample, where a rectangular-shape crater is desirable to obtain better interface resolution.…”
Section: Application Of Dual-step Pulse Voltage To the Excitation Soumentioning
confidence: 99%