2002
DOI: 10.1063/1.1525056
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Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy

Abstract: Using dynamic force microscopy and spectroscopy in an ultrahigh vacuum (“noncontact atomic force microscopy”) at low temperatures, we measured three-dimensional force fields with atomic resolution. The method is based on the systematic recording of the frequency shift of a cantilever oscillating near the sample surface. The presented experimental results were obtained on a NiO(001) sample surface with an iron-coated silicon tip, but the measurement principle can be extended to any tip–sample system.

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Cited by 143 publications
(110 citation statements)
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“…The 3D Áf image is constructed from either approaching or retracting Z profiles at each XY positions. The quantitative 3D force image is obtained by applying the force conversion formula [15] to the individual Z profiles constituting the 3D Áf image.Previously reported 3D imaging techniques using SFM were developed based on 1D spectroscopy [16] or 2D constant height imaging [17][18][19] and hence have no tipsample distance regulation during the measurement. In addition, owing to the complicated tip motion, these techniques take a measurement time on the order of hours or …”
mentioning
confidence: 99%
See 1 more Smart Citation
“…The 3D Áf image is constructed from either approaching or retracting Z profiles at each XY positions. The quantitative 3D force image is obtained by applying the force conversion formula [15] to the individual Z profiles constituting the 3D Áf image.Previously reported 3D imaging techniques using SFM were developed based on 1D spectroscopy [16] or 2D constant height imaging [17][18][19] and hence have no tipsample distance regulation during the measurement. In addition, owing to the complicated tip motion, these techniques take a measurement time on the order of hours or …”
mentioning
confidence: 99%
“…Previously reported 3D imaging techniques using SFM were developed based on 1D spectroscopy [16] or 2D constant height imaging [17][18][19] and hence have no tipsample distance regulation during the measurement. In addition, owing to the complicated tip motion, these techniques take a measurement time on the order of hours or days.…”
mentioning
confidence: 99%
“…Atomic resolution imaging and subsequent 3D force field spectroscopy [6] were performed with a metallic Crcoated tip [ÁfðUÞ curve as in Fig. 1(a)] within the region displayed in Fig.…”
mentioning
confidence: 99%
“…Owing to the continuous Z scan signal, 3D-SFM is much faster than the previously proposed 3D measurement methods [45,46]. We typically obtain a full 3D ∆ f image in 53 sec with a scan size of 4 × 4 × 2 nm 2 and a pixel resolution of 64 ×64× 256 pixels in XY Z.…”
Section: D Scanning Force Microscopymentioning
confidence: 99%
“…Copyright 2010, American Physical Society.) [45]. In their method, ∆ f versus distance curves were measured at 32 × 32 grid positions with a measurement time of 80 min.…”
Section: Advanced Instrumentationmentioning
confidence: 99%