Measurement of the thermal coefficients of nonreversible phase-change optical recording films

Abstract

We have developed a procedure to obtain the critical temperature for the amorphous-to-crystalline phase transition as well as the thermal conductivity and the specific heat of the phase-change media of optical recording. The procedure involves estimating the thermal conductivity from the data obtained by measuring the threshold cw laser power required for inducing phase transition. Then, from the data obtained in short-pulse measurements, we estimate the specific heat. In principle this method can yield the thermal parameters of any number of layers, so long as one of the layers is made of a phase-change material having a well-defined transition temperature.

Optical Data Storage

“…[103], [104] interfacial thermal resistances in between the films have a great influence on the [99], the photo acoustic method [100], [101], [102] and the photo thermal wave ties of amorphous phase-change recording stacks. [105], [106] The laser power Meinders et al for a non-rotating disc case. [107] The method is based on the detect-the applied laser power.…”

Progress on a New Non-Volatile Memory for Space Based on Chalcogenide Glass

“…Polycrystalline State Ovonyx, Inc., under license from Energy Conversion Devices, Inc., is working with several commercial partners to develop a solid-state non-volatile memory technology using the chalcogenide phase change material (Mao, 1995;Hsieh, 1997;Maimon, 2001).…”