2009
DOI: 10.5194/tc-3-167-2009
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of the specific surface area of snow using infrared reflectance in an integrating sphere at 1310 and 1550 nm

Abstract: Abstract. Even though the specific surface area (SSA) and the snow area index (SAI) of snow are crucial variables to determine the chemical and climatic impact of the snow cover, few data are available on the subject. We propose here a novel method to measure snow SSA and SAI. It is based on the measurement of the hemispherical infrared reflectance of snow samples using the DUFISSS instrument (DUal Frequency Integrating Sphere for Snow SSA measurement). DUFISSS uses the 1310 or 1550 nm radiation of laser diode… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

12
378
1

Year Published

2014
2014
2017
2017

Publication Types

Select...
10

Relationship

1
9

Authors

Journals

citations
Cited by 231 publications
(414 citation statements)
references
References 53 publications
12
378
1
Order By: Relevance
“…This instrument measures the reflectance (at 1300 and 805 nm) of the snow face in drilled holes with a centimeter vertical resolution. The reflectances are converted into specific surface area (SSA) using a complex algorithm ) that was validated with independent measurements (Gallet et al, 2009). The accuracy was estimated to 12 %.…”
Section: Snow Propertiesmentioning
confidence: 99%
“…This instrument measures the reflectance (at 1300 and 805 nm) of the snow face in drilled holes with a centimeter vertical resolution. The reflectances are converted into specific surface area (SSA) using a complex algorithm ) that was validated with independent measurements (Gallet et al, 2009). The accuracy was estimated to 12 %.…”
Section: Snow Propertiesmentioning
confidence: 99%
“…The IceCube instrument (A2 Photonic Sensors, Grenoble, France) (Fig. 3g, h) (Zuanon, 2013) is similar to DUFISSS presented by Gallet et al (2009), but it uses only 1310 nm wavelength laser for reflectance measurements. Measurement procedure includes calibration, snow sampling, measurement of the snow samples with the instrument, and conversion of measured values to SSA with software.…”
Section: Specific Surface Areamentioning
confidence: 99%
“…A proper validation of these parameterizations is, however, still lacking. The development of new observation techniques for radiation (Nicolaus et al, 2010b;Hudson et al, 2012) and snow and ice properties (Arnaud et al, 2011;Gallet at al., 2009) has the potential to facilitate the future collection of high quality and complete data sets. There is also need for more realistic melt pond parameterizations, which, in addition to albedo, account for the latent heat, which has impact on the timing of autumn freeze-up.…”
Section: Main Advances and Remaining Challenges In Individual Researcmentioning
confidence: 99%