2016
DOI: 10.1016/j.ultramic.2015.11.015
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Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope

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Cited by 19 publications
(32 citation statements)
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“…The NSMM is calibrated [11] from approach curve measurements on isotropic and reproducible materials for which traceable measurements of permittivity are available. High-purity polished fused silica (FSIL), undoped single-crystal yttrium aluminium garnet (YAG) and lanthanum aluminate (LAO) are used in the work described.…”
Section: (A) Reference Materialsmentioning
confidence: 99%
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“…The NSMM is calibrated [11] from approach curve measurements on isotropic and reproducible materials for which traceable measurements of permittivity are available. High-purity polished fused silica (FSIL), undoped single-crystal yttrium aluminium garnet (YAG) and lanthanum aluminate (LAO) are used in the work described.…”
Section: (A) Reference Materialsmentioning
confidence: 99%
“…1. A detailed account of the design and construction of the microscope has recently been published [11]. In the present paper, calibration and imaging measurements are made with a spherical tip 0.1Ø mm manufactured by electro-discharge machining (EDM) [12], and a conical tip manufactured by electrochemical etching (Everbeing T20-100) -see Fig.…”
Section: Introductionmentioning
confidence: 99%
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