Measurement of the inclusive jet cross section using the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi>k</mml:mi><mml:mi mathvariant="normal">T</mml:mi></mml:msub></mml:math>algorithm in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>p</mml:mi><mml:mover accent="true"><mml:mi>p</mml:mi><mml:mo>¯</mml:mo></mml:mover></mml:math>collisions at<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msqrt><mml:m

Abulencia, A.; Adelman, J.; Affolder, A. A.; Akimoto, T.; Albrow, M.; Ambrose, D.; Amerio, S.; Amidei, D.; Anastassov, A.; Anikeev, K.; Annovi, A.; Antos̆, J.; Aoki, M.; Apollinari, G.; Arguin, J-F.; Arisawa, T.; Artikov, A.; Ashmanskas, W.; Attal, A.; Azfar, F.; Azzi-Bacchetta, P.; Azzurri, P.; Bacchetta, N.; Badgett, W.; Barbaro‐Galtieri, A.; Barnes, V. E.; Barnett, B. A.; Baroiant, S.; Bartsch, V.; Bauer, G.; Bedeschi, F.; Behari, S.; Belforte, S.; Bellettini, G.; Bellinger, J.; Belloni, A.; Benjamin, D.; Beretvas, A.; Beringer, J.; Berry, T.; Bhatti, A.; Binkley, M.; Bisello, D.; Blair, R. E.; Blocker, C.; Blumenfeld, B.; Bocci, A.; Bodek, A.; Boisvert, V.; Bolla, G.; Bolshov, A.; Bortoletto, D.; Boudreau, J.; Boveia, A.; Brau, B.; Brigliadori, L.; Bromberg, C.; Brubaker, E.; Budagov, J.; Budd, H. S.; Budd, S.; Budroni, S.; Burkett, K.; Busetto, G.; Bussey, P.; Byrum, K. L.; Cabrera, S.; Campanelli, M.; Campbell, M.; Canelli, F.; Canepa, A.; Carillo, Serge; Carlsmith, D.; Carosi, R.; Carron, S.; Casarsa, M.; Castro, A.; Catastini, P.; Cauz, D.; Cavalli‐Sforza, M.; Cerri, A.; Cerrito, L.; Chang, S.; Chen, Y. C.; Chertok, M.; Chiarelli, G.; Chlachidze, G.; Chlebana, F.; Cho, I.; Cho, K.; Chokheli, D.; Chou, J. P.; Choudalakis, G.; Chuang, S. H.; Chung, K.; Chung, W. H.; Chung, Y. S.; Ciljak, M.; Ciobanu, C. I.; Ciocci, M. A.; Clark, A.; Clark, D.; Coca, M.; Compostella, G.; Convery, M. E.; Conway, J.; Cooper, B. D.; Copic, K.; Cordelli, M.; Cortiana, G.; Crescioli, F.; Almenar, C. Cuenca; Cuevas, J.; Culbertson, R.; Cully, J. C.; Cyr, D.; DaRonco, S.; Datta, M.; D’Auria, S.; Davies, T.; D’Onofrio, M.; Dagenhart, D.; Barbaro, P. de; Cecco, S. De; Deisher, A.; Lentdecker, G. De; Dell’Orso, M.; Paoli, F. Delli; Demortier, L.; Deng, J.; Deninno, M.; Pedis, D. De; Derwent, P. F.; Giovanni, G. P. Di; Dionisi, C.; Ruzza, B. Di; Dittmann, J.; DiTuro, P.; Dörr, C.; Donati, S.; Donegà, M.; Dong, P.; Donini, J.; Dorigo, T.; Dubé, S.; Efron, J.; Erbacher, R.; Errede, D.; Errede, S.; Eusebi, R.; Fang, H. C.; Farrington, S. M.; Fedorko, I.; Fedorko, W.; Feild, R. G.; Feindt, M.; Fernández, J. P.; Field, R. D.; Flanagan, G.; Foland, A.; Forrester, S.; Foster, G. W.; Franklin, M.; Freeman, J.; Furic, I. K.; Gallinaro, M.; Galyardt, J.; Garcia, J. E.; Garberson, F.; Garfinkel, A. F.; Gerberich, H.; Gerdes, D. W.; Giagu, S.; Giannetti, P.; Gibson, A.; Gibson, K.; Gimmell, J. L.; Ginsburg, C. M.; Giokaris, N.; Giordani, M. P.; Giromini, P.; Giunta, M.; Giurgiu, G.; Glagolev, V.; Glenzinski, D.; Gold, M.; Goldschmidt, N.; Goldstein, J.; Golossanov, A.; Gómez, G.; Gómez-Ceballos, G.; Goncharov, M.; González, O.; Gorelov, I.; Goshaw, A. T.; Goulianos, K.; Gresele, A.; Griffiths, M.; Grinstein, S.; Grosso-Pilcher, C.; Grundler, U.; Costa, J. Guimarães da; Gunay-Unalan, Z.; Haber, C.; Hahn, K. A.; Hahn, S. R.; Halkiadakis, E.; Hamilton, A.; Han, B. Y.; Han, J.; Handler, R.; Happacher, F.; Hara, K.; Hare, M.; Harper, S.; Harr, R.; Harris, R. M.; Hartz, M.; Hatakeyama, K.; Hauser, J.; Heijboer, A.; Heinemann, B.; Heinrich, J.; Henderson, C.; Herndon, M.; Heuser, J.; Hidas, D.; Hill, C.; Hirschbuehl, D.; Höcker, A.; Holloway, A.; Hou, S.; Houlden, M.; Hsu, S.‐C.; Huffman, B. T.; Hughes, R.; Husemann, U.; Huston, J.; Incandela, J.; Introzzi, G.; Iori, M.; Ishizawa, Y.; Ivanov, A.; Iyutin, B.; James, E.; Jang, D.; Jayatilaka, B.; Jeans, D.; Jensen, H.; Jeon, E. J.; Jindariani, S.; Jones, M.; Joo, K. K.; Jun, S. Y.; Jung, Jerome; Junk, T. R.; Kamon, T.; Karchin, P. E.; Kato, Y.; Kemp, Y.; Kephart, R.; Kerzel, U.; Khotilovich, V.; Kilminster, B.; Kim, D. H.; Kim, H. S.; Kim, J. E.; Kim, M. J.; Kim, S. B.; Kim, S. H.; Kim, Y. K.; Kimura, N.; Kirsch, L.; Klimenko, S.; Klute, M.; Knuteson, B.; Ko, B. R.; Kondo, K.; Kong, D. J.; Königsberg, J.; Korytov, A.; Kotwal, A.; Kovalev, A.; Kraan, A.; Kraus, J.; Kravchenko, I.; Kreps, M.; Kroll, J.; Krumnack, N.; Kruse, M. C.; Krutelyov, V.; Kubo, T.; Kuhlmann, S. E.; Kuhr, T.; Kusakabe, Y.; Kwang, S.; Laasanen, A. T.; Lai, S.; Lami, S.; Lammel, S.; Lancaster, M.; Lander, R.; Lannon, K.; Lath, A.; Latino, G.; Lazzizzera, I.; LeCompte, T.; Lee, J.; Lee, Y. J.; Lee, S. W.; Lefèvre, R.; Leonardo, N.; Leone, S.; Levy, S.; Lewis, J. D.; Lin, C.; Lin, C. S.; Lindgren, M.; Lipeles, E.; Lister, A.; Litvintsev, D. O.; Liu, T.; Lockyer, N. S.; Loginov, A.; Loreti, M.; Loverre, P.; Lu, R.-S.; Lucchesi, D.; Lujan, P.; Lukens, P.; Lungu, G.; Lyons, L.; Lys, J.; Lysák, R.; Lytken, E.; Mack, P.; MacQueen, D.; Madrak, R.; Maeshima, K.; Makhoul, K.; Mäki, T.; Maksimović, P.; Malde, S.; Manca, G.; Margaroli, F.; Marginean, R.; Marino, C.; Marino, C. P.; Martín, A.; Martin, M.; Martin, V. J.; Martı́nez, M.; Maruyama, T.; Mastrandrea, P.; Masubuchi, T.; Matsunaga, H.; Mattson, M. E.; Mazini, R.; Mazzanti, P.; McFarland, K. S.; McIntyre, P.; McNulty, R.; Mehta, A.; Mehtälä, P.; Menzemer, S.; Menzione, A.; Merkel, P.; Mesropian, C.; Messina, A.; Miao, T.; Miladinovic, N.; Miles, J.; Miller, R.; Mills, C.; Milnik, M.; Mitra, A.; Mitselmakher, G.; Miyamoto, A.; Moêd, S.; Moggi, N.; Mohr, B.; Moore, R. W.; Morello, M. J.; Fernandez, P. Movilla; Mülmenstädt, J.; Mukherjee, A.; Müller, Th.; Mumford, R.; Murat, P.; Nachtman, J.; Nagano, A.; Naganoma, J.; Nakano, I.; Napier, A.; Necula, V.; Neu, C.; Neubauer, M. S.; Nielsen, J.; Nigmanov, T.; Nodulman, L.; Norniella, O.; Nurse, E.; Oh, S. H.; Oh, Y. D.; Oksuzian, I.; Okusawa, T.; Oldeman, R.; Orava, R.; Österberg, K.; Pagliarone, C.; Palencia, E.; Papadimitriou, V.; Paramonov, A.; Parks, B.; Pashapour, S.; Patrick, J.; Pauletta, G.; Paulini, M.; Paus, C.; Pellett, D.; Penzo, A.; Phillips, T. J.; Piacentino, G.; Piedra, J.; Pinera, L.; Pitts, K.; Plager, C.; Pondrom, L.; Portell, X.; Poukhov, O.; Pounder, N.; Prakoshyn, F.; Pronko, A.; Proudfoot, J.; Ptohos, F.; Punzi, G.; Pursley, J.; Rademacker, J. H.; Rahaman, A.; Ranjan, N.; Rappoccio, S.; Reisert, B.; Rekovic, V.; Renton, P.; Rescigno, M.; Richter, S.; Rimondi, F.; Ristori, L.; Robson, A.; Rodrigo, T.; Rogers, E.; Rolli, S.; Roser, R.; Rossi, M.; Rossin, R.; Ruiz, A.; Russ, J.; Rusu, V.; Saarikko, H.; Sabik, S.; Safonov, A.; Sakumoto, W. K.; Salamanna, G.; Saltó, O.; Saltzberg, D.; Sánchez, C.; Santi, L.; Sarkar, S.; Sartori, L.; Sato, K.; Savard, P.; Savoy-Navarro, A.; Scheidle, T.; Schlabach, P.; Schmidt, E. E.; Schmidt, M. P.; Schmitt, Michael Henry; Schwarz, Thomas; Scodellaro, L.; Scott, A. L.; Scribano, A.; Scuri, F.; Sedov, A.; Seidel, S. C.; Seiya, Y.; Semenov, A.; Sexton-Kennedy, L.; Sfyrla, A.; Shapiro, M.; Shears, T.; Shepard, P. F.; Sherman, D.; Shimojima, M.; Shochet, M.; Shon, Y.; Shreyber, I.; Sidoti, A.; Sinervo, P.; Sisakyan, A. N.; Sjölin, J.; Slaughter, A. J.; Slaunwhite, J.; Sliwa, K.; Smith, J. R.; Snider, F. D.; Snihur, R.; Soderberg, M.; Soha, A.; Somalwar, S.; Sorı́n, V.; Spalding, J.; Spinella, F.; Spreitzer, T.; Squillacioti, P.; Stanitzki, M. M.; Staveris-Polykalas, A.; Denis, R. St.; Stelzer, B.; Stelzer-Chilton, O.; Stentz, D.; Strologas, J.; Stuart, D.; Suh, J. S.; Суханов, А.; Sun, H.; Suzuki, T.; Taffard, A.; Takashima, R.; Takeuchi, Y.; Takikawa, K.; Tanaka, M.; Tanaka, R.; Tecchio, M.; Teng, P. K.; Terashi, K.; Thom, J.; Thompson, A. S.; Thomson, E.; Tipton, P.; Tiwari, V.; Tkaczyk, S.; Toback, D.; Tokár, S.; Tollefson, K.; Tomura, T.; Tonelli, D.; Torre, S.; Torretta, D.; Tourneur, S.; Trischuk, W.; Tsuchiya, Ryosuke; Tsuno, S.; Turini, N.; Ukegawa, F.; Unverhau, T.; Uozumi, S.; Usynin, D.; Vallecorsa, S.; Remortel, N. Van; Varganov, A.; Vataga, E.; Vázquez, F.; Velev, G.; Veramendi, G.; Veszprémi, V.; Vidal, R.; Vila, I.; Vilar, R.; Vine, T.; Vollrath, I.; Volobouev, I.; Volpi, G.; Würthwein, F.; Wagner, P.; Wagner, R. G.; Wagner, R. L.; Wagner, J.; Wagner, W.; Wallny, R.; Wang, S. M.; Warburton, A.; Waschke, S.; Waters, D.; Weinberger, M.; Wester, W. C.; Whitehouse, B.; Whiteson, D.; Wicklund, A. B.; Wicklund, E.; Williams, G.; Williams, H. H.; Wilson, P.; Winer, B. L.; Wittich, P.; Wolbers, S.; Wolfe, C.; Wright, T.; Wu, X.; Wynne, S. M.; Yagil, A.; Yamamoto, K.; Yamaoka, J.; Yamashita, T.; Yang, C.; Yang, U. K.; Yang, Y.; Yao, W-M.; Yeh, G. P.; Yoh, J.; Yorita, K.; Yoshida, T.; Yu, G. B.; Yu, I.; Yu, S. S.; Yun, J. C.; Zanello, L.; Zanetti, A.; Zaw, I.; Zhang, X.; Zhou, J.; Zucchelli, S.

doi:10.1103/physrevd.75.092006

Cited by 127 publications

(96 citation statements)

References 50 publications

(18 reference statements)

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The D0 nuisance parameters spread in the range from -1.5 to 4.1 and in general their distribution is comparable to the normal Gaussian Figure 3. Values of the nuisance parameters r for the D0 data [1] (left) and the CDF ones [2] (right) with the uncertainties due to data fluctuation (inner bars) and the total uncertainties including the ones due to PDFs (outer bars) versus the nuisance parameter number n. The luminosity nuisance parameters correspond to n = 6 and 17 for D0 and CDF, respectively.…”

Section: Analysis Of D0 Resultsmentioning

confidence: 99%

“…For the variant of fit without the D0 luminosity uncertainty taken into account the value of χ 2 grows by less than 1 for 110 data points. The change in the gluon distribution obtained figure 1 for the CDF data on inclusive jet production [2]. The curves superimposed display a normal Gaussian distribution normalized on the total number of the nuisance parameters.…”

Section: Jhep02(2014)041mentioning

confidence: 99%

“…[10] for a recent review. For brevity we consider in the following only two Tevatron inclusive jet data sets [1,2] obtained by the D0 and CDF collaborations, respectively, which nonetheless give a representative illustration of the issues discussed in the paper. Both data sets were collected in Run II and each corresponds to an integral luminosity of about 1fb −1 .…”

Section: Comparison Of the Abkm09 And Abm11 Fits With Tevatron Jet Datamentioning

confidence: 99%

“…At this end proper statistical treatment of the data is required since uncertainties in the data of refs. [1,2] are dominated by the correlated systematics and the simplest χ 2 estimator is inapplicable. In this case one should ideally use the χ 2 estimator including the covariance matrix, which encodes the error correlations.…”

Section: Introductionmentioning

confidence: 99%

“…Indeed, the gluon distribution directly enters into the jet production cross section in contrast to the deepinelastic-scattering (DIS) process, which provides only an indirect constraint on the gluon distribution, through the QCD evolution. The Tevatron jet production data [1,2] are used in the global fits of parton distribution functions (PDFs) to improve accuracy of the gluon distribution, particularly at large x. At this end proper statistical treatment of the data is required since uncertainties in the data of refs.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Statistical issues in the parton distribution analysis of the Tevatron jet data

Alekhin

Blümlein

Moch

2014

J. High Energ. Phys.

View full text Add to dashboard Cite

We analyse a tension between the D0 and CDF inclusive jet data and the perturbative QCD calculations, which are based on the ABKM09 and ABM11 parton distribution functions (PDFs) within the nuisance parameter framework. Particular attention is paid on the uncertainties in the nuisance parameters due to the data fluctuations and the PDF errors. We show that with account of these uncertainties the nuisance parameters corresponding to the luminosity uncertainties in the D0 and the CDF data sets take the values r D0 norm = 4.1 ± 1.3 and r CDF norm = 5.4 ± 1.7, respectively, while dropping luminosity uncertainty leads to variation of the PDFs well within uncertainties. A statistical bias of the estimator based on the nuisance parameters is also discussed.

show abstract

Section: Analysis Of D0 Resultsmentioning

confidence: 99%

Section: Jhep02(2014)041mentioning

confidence: 99%