1989
DOI: 10.1103/physrevb.39.6807
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Measurement of the fourth moment of the current distribution in two-dimensional random resistor networks

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Cited by 63 publications
(57 citation statements)
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“…For a random resistor network, the change in resistance due to Joule heating, in the first approximation, DR R 2 R o is given by abhR 2 o SI 2 [12]. Hence,…”
Section: Predictable Electrical Breakdown In Compositesmentioning
confidence: 99%
“…For a random resistor network, the change in resistance due to Joule heating, in the first approximation, DR R 2 R o is given by abhR 2 o SI 2 [12]. Hence,…”
Section: Predictable Electrical Breakdown In Compositesmentioning
confidence: 99%
“…We think, however, that the potential distribution across the whole structure ͑especially at the dead ends͒ might take place in such a way that it leads to nearly the same resistance values in the LRS for different Ge 0.3 Se 0.7 layer thicknesses. 21 We cannot exclude, however, that the resistances in the LRS will show some scaling behavior with further increase in thickness.…”
mentioning
confidence: 99%
“…The cubic nonlinearity can be accessed in ac transport measurements by detecting a third-harmonic voltage signal V 3ω , see e.g. [20,22,23]. In general, noise spectroscopy and nonlinear transport are a measure of the fourth moment of the current distribution [22] and therefore probe the microgeometry of the electronic system, which is not accessible by the linear (Ohmic) resistance, being related to the second moment of the current distribution [24].…”
mentioning
confidence: 99%