1989
DOI: 10.1103/physrevb.39.5771
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of the effect of uniaxial stress on the spectrum ofCaF2:Pr3+

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
2
0

Year Published

1992
1992
2020
2020

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(2 citation statements)
references
References 12 publications
0
2
0
Order By: Relevance
“…3 a). In addition to the displacement of the center of the spectral hole, we also observe a broadening of the profile, which is partly due to inhomogeneities on the microscopic level in the different ions' response to applied strain, as observed in other rare-earth doped systems [28,29], partly due to a residual inhomogeneity in the applied strain.…”
mentioning
confidence: 51%
“…3 a). In addition to the displacement of the center of the spectral hole, we also observe a broadening of the profile, which is partly due to inhomogeneities on the microscopic level in the different ions' response to applied strain, as observed in other rare-earth doped systems [28,29], partly due to a residual inhomogeneity in the applied strain.…”
mentioning
confidence: 51%
“…Instead, we may, at least partially, attribute the observed effect to an inhomogeneity of the different ions' responses on a microscopic scale, as suggested by other authors for a different system [22]. In our case, the ions forming the spectral hole all have a slightly different electromagnetic environment, coming from a nonuniform distribution of static strain within the crystal which stems essentially from local distortion of the crystal lattice due to doping, which also accounts for the large inhomogeneous profile.…”
mentioning
confidence: 62%