Measurement of the b → τX branching ratio

Buskulic, D.; Décamp, D.; Goy, C.; Lees, J. P.; Minard, M.-N.; Mours, B.; Alemany, R.; Ariztizabal, F.; Comas, P.; Crespo, J.M.; Delfino, M.; Fernández, E.; Gaitan, V.; Garrido, Ll.; Mattison, T. S.; Pacheco, A.; Pascual, Á.; Creanza, D.; Palma, M. De; Farilla, A.; Iaselli, G.; Mäggi, G.; Maggi, M.; Natali, S.; Nuzzo, S.; Quattromini, M.; Ranieri, A.; Raso, G.; Romanò, F.; Ruggieri, F.; Selvaggi, G.; Silvestris, L.; Tempesta, P.; Zito, G.; Hu, H.; Huang, D.; Huang, X. T.; Lin, J.; Lou, J.; Qiao, C. F.; Wang, T.; Xie, Y.; Xu, D.; Xu, R.; Zhang, J.; Zhao, W.; Bauerdick, L. A. T.; Blucher, E.; Bonvicini, G.; Bossi, F.; Boudreau, J.; Casper, D.; Drevermann, H.; Forty, R.; Ganis, G.; Gay, C.; Hagelberg, R.; Harvey, J.; Haywood, S. J.; Hilgart, J.; Jacobsen, R.G.; Jost, B.; Knobloch, J.; Lançon, E.; Lehraus, I.; Löhse, T.; Lusiani, A.; Martı́nez, M.; Mató, P.; Meinhard, H.; Minten, A.; Miquel, R.; Moser, H. G.; Palazzi, P.; Perlas, J. A.; Pusztaszeri, J. F.; Ranjard, F.; Redlinger, G.; Rolandi, G.; Rothberg, J.; Ruan, T.; Saich, M.; Schlatter, D.; Schmelling, M.; Sefkow, F.; Tejessy, W.; Wachsmuth, H.; Wiedenmann, W.; Wildish, T.; Witzeling, W.; Wotschack, J.; Ajaltouni, Z.; Badaud, F.; Bardadin-Otwinowska, M.; Bencheikh, A. M.; Fellous, R. El; Falvard, A.; Gay, P.; Guicheney, C.; Henrard, P.; Jousset, J.; Michel, B.; Montret, Jean-Claude; Pallin, D.; Perret, P.; Pietrzyk, B.; Proriol, J.; Prulhière, F.; Stimpfl, G.; Fearnley, T.; Hansen, J. D.; Hansen, J. R.; Hansen, P. H.; Möllerud, R.; Nilsson, B.S.; Efthymiopoulos, I.; Kyriakis, A.; Simopoulou, E.; Vayaki, A.; Zachariadou, K.; Badier, J.; Blondel, A.; Bonneaud, G. R.; Brient, J. C.; Fouque, G.; Orteu, S.; Rosowsky, A.; Rougé, A.; Rumpf, M.; Tanaka, R.; Verderi, M.; Videau, H.; Candlin, D. J.; Parsons, M. I.; Veitch, E.; Moneta, L.; Parrini, G.; Corden, M.; Georgiopoulos, C.; Ikeda, M.; Lannutti, J.; Levinthal, D.; Mermikides, M.; Sawyer, L.; Wasserbaech, S.; Antonelli, A.; Baldini, R.; Bencivenni, G.; Bologna, G.; Campana, P.; Capon, G.; Cerutti, F.; Chiarella, V.; D’Ettorre-Piazzoli, B.; Felici, G.; Laurelli, P.; Mannocchi, G.; Murtas, F.; Murtas, F.; Passalacqua, L.; Pepe-Altarelli, M.; Picchi, P.; Altoon, B.; Boyle, O.; Colrain, P.; Have, I. ten; Lynch, J.G.; Maitland, W.; Morton, W. T.; Raine, C.; Scarr, J. M.; Smith, K. M.; Thompson, A. S.; Turnbull, R.M.; Brandl, B.; Braun, O.; Geweniger, C.; Hanke, P.; Hepp, V.; Kluge, E. E.; Maumary, Y.; Putzer, A.; Rensch, B.; Stahl, A.; Tittel, K.; Wunsch, M.; Belk, A. T.; Beuselinck, R.; Binnie, D. M.; Cameron, W.; Cattaneo, M.; Colling, D.; Dornan, P. J.; Dugeay, S.; Greene, A. M.; Hassard, J. F.; Lieske, N. M.; Nash, J.A.; Patton, S.; Payne, D. G.; Phillips, M. J.; Sedgbeer, J. K.; Tomalin, I. R.; Wright, A. G.; Kneringer, E.; Kühn, D.; Rudolph, G.; Bowdery, C. K.; Brodbeck, T. J.; Finch, A. J.; Foster, F.; Hughes, G.; Jackson, D.; Keemer, N. R.; Nuttall, M.; Patel, Apoorva; Sloan, T.; Snow, S. W.; Whelan, E. P.; Kleinknecht, K.; Raab, J.; Renk, B.; Sander, H. G.; Schmidt, H. R.; Steeg, F.; Walther, S. M.; Wolf, B.; Aubert, J.J.; Benchouk, C.; Bonissent, A.; Carr, J.; Coyle, P.; Drinkard, J.; Etienne, F.; Papalexiou, S.; Payre, P.; Qian, Z.; Roos, L.; Rousseau, D.; Schwemling, Ph.; Talby, M.; Adlung, S.; Bauer, C.; Blum, W.; Brown, D.; Cattaneo, P. W.; Cowan, G.; Dehning, B.; Dietl, H.; Dydak, F.; Fernández-Bosman, M.; Frank, M.; Halley, A.W.; Lauber, J.; Lütjens, G.; Lütz, G.; Männer, W.; Richter, R.; Rotscheidt, H.; Schröder, J.; Schwarz, A. S.; Settles, R.; Seywerd, H.; Stierlin, U.; Stiegler, U.; Denis, R. St.; Takashima, M.; Thomas, J. P.; Wolf, G.; Boucrot, J.; Callot, O.; Cordier, A.; Davier, M.; Grivaz, J.-F.; Heusse, P.; Jaffe, D. E.; Janot, P.; Kim, D.W.; Diberder, F. Le; Lefrançois, J.; Lutz, A. M.; Schune, M. H.; Veillet, J. J.; Videau, I.; Zhang, Z.; Abbaneo, D.; Amendolia, S. R.; Bagliesi, G.; Batignani, G.; Bosisio, L.; Bottigli, U.; Bozzi, C.; Bradaschia, C.; Carpinelli, M.; Ciocci, M. A.; Dell’Orso, R.; Ferrante, I.; Fidecaro, F.; Foà, L.; Focardi, E.; Forti, F.; Giassi, A.; Giorgi, M. A.; Ligabue, F.; Mannelli, E. B.; Marrocchesi, P. S.; Messineo, A.; Palla, F.; Rizzo, G.; Sanguinetti, G.; Spagnolo, P.; Steinberger, J.; Тенчини, Р.; Tonelli, G.; Triggiani, G.; Vannini, C.; Venturi, A.; Verdini, P. G.; Walsh, J.; Carter, J.M.; Green, M.G.; March, P.V.; Mir, L. M.; Medcalf, T.; Quazi, I. S.; Strong, J. A.; West, L.R.; Botterill, D.; Clifft, R. W.; Edgecock, T.R.; Edwards, M.; Fisher, S. M.; Jones, T. J.; Norton, P. R.; Salmon, D. P.; Thompson, J.C.; Bloch-Devaux, B.; Colas, P.; Duarte, H.; Kozanecki, W.; Lemaire, M. C.; Locci, E.; Loucatos, S.; Monnier, E.; Pérez, P.; Perrier, Frédéric; Rander, J.; Renardy, J. F.; Roussarie, A.; Schuller, J. P.; Schwindling, J.; Mohand, D. Si; Vallage, B.; Johnson, R.P.; Litke, A. M.; Taylor, G.N.; Wear, J.; Ashman, J. G.; Babbage, W.; Booth, C.N.; Buttar, C. M.; Carney, R.; Cartwright, S.; Combley, F.; Hatfield, F.; Reeves, P.; Thompson, L.F.; Barberio, E.; Böhrer, A.; Brandt, Siegmund; Grupen, C.; Rivera, F.; Schäfer, U.; Giannini, G.; Gobbo, B.; Ragusa, F.; Bellantoni, L.; Chen, W.; Cinabro, D.; Conway, J.; Cowen, D. F.; Feng, Z.; Ferguson, D.P.S.; Gao, Y. S.; Grahl, J.; Harton, J. L.; Jared, R. C.; LeClaire, B. W.; Lishka, C.; Pan, Y.; Pater, J. R.; Saadi, Y.; Sharma, V.; Schmitt, M.; Shi, Z. H.; Walsh, A. M.; Weber, F. V.; Whitney, Milton; Wu, S. L.; Wu, X.; Zobernig, G.

doi:10.1016/0370-2693(93)91853-f

Cited by 51 publications

(28 citation statements)

References 10 publications

(2 reference statements)

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“…In the three-dimensional case, shown on the right in gure 3, the track curvature has been exaggerated to emphasise that tracks are approximately helical in three dimensions. In the ALEPH de nition of the three-dimensional impact parameter [10], the tangent of the track helix is found at its point of closest approach, S, to the jet axis, and the impact parameter is de ned as the perpendicular distance of this tangent from the primary vertex. The impact parameter is signed positive or negative according to whether this point o f closest approach, S, of the track helix to the axis is in front of, or behind, the primary vertex relative to the jet axis.…”

Section: Impact Parameter Lifetime Tagsmentioning

confidence: 99%

“…A more sophisticated way of using impact parameter information has been devised by ALEPH [10]. This proceeds by estimating the probability, P T , that each track with a positive signed impact parameter signi cance, S > 0, is actually a track from the primary vertex.…”

Section: Impact Parameter Lifetime Tagsmentioning

confidence: 99%

“…This works well, but is only appropriate in a subset of analyses, due to its statistical nature. 3.1.3 Lifetime Tag Performance b e ciency " b (%) b purity (%) ALEPH [10] 26 96 DELPHI [13] 24 89 OPAL [15] 19 95 Table 2: E ciencies and purities of b quark hemisphere tags using lifetime information. The e ciencies quoted are for a hemisphere of the event { the e ciency for tagging either hemisphere of an event is higher, being approximately 2" b (" b ) 2 .…”

Section: Reconstructed Secondary Vertex Tagsmentioning

confidence: 99%

“…The average shown includes the results shown in the gure, taking into account common systematic errors between experiments [35]. Results shown in the gure are the quoted results from the original references [10,13,15,18,19,26,28,36], which can assume di erent v alues of cc = had . Where the cc = had error was quoted as a separate error source, it has been excluded from the results shown.…”

mentioning

confidence: 98%

“…Error Source ALEPH [10] OPAL [15] Detector/Simulation E ects (26) are made, where N v is the number of forward tagged hemispheres, N v the number of backward tagged hemispheres, N vv the numb e r o f e v ents with both hemispheres forward tagged, N vv the numb e r o f e v ents with one forward and one backward tagged hemisphere, and N vv the number with both hemispheres backward tagged. This statistical subtraction reduces signi cantly the sensitivity of the result to resolution uncertainties, at the cost of an increase in statistical error.…”

mentioning

confidence: 99%

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Electroweak measurements using heavy quarks at LEP

Behnke

Charlton

1995

Phys. Scr.

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Electroweak measurements at the LEP electron-positron collider have been made both for di erent lepton and quark avours. The measurements in the heavy quark sector, speci cally of the partial widths for Z 0 decays to bb and cc and the forward-backward b and c quark production asymmetries, are reviewed. Combined values from the LEP measurements are derived of bb = had = 0 : 2207 0:0022, cc = had = 0 : 153 0:011, and for the asymmetries at p s = 9 1 : 26 GeV, A b FB = 0 : 0902 0:0045 and A c FB = 0 : 070 0:012. In the framework of the standard model, a value of bb = had = 0 : 2189 0:0020 is obtained (for cc = had = 0 : 171). The b asymmetry is used to measure the e ective electroweak mixing angle sin 2 e W = 0 : 2328 0:0008.

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Section: Impact Parameter Lifetime Tagsmentioning

confidence: 99%

Section: Impact Parameter Lifetime Tagsmentioning

confidence: 99%

Section: Reconstructed Secondary Vertex Tagsmentioning

confidence: 99%

mentioning

confidence: 98%

mentioning

confidence: 99%

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