2013
DOI: 10.1051/epjap/2012120442
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Measurement of secondary ionization coefficient of CaO film electrode

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Cited by 4 publications
(9 citation statements)
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“…Nevertheless, γ subsequently increases but the value of E/p 0 corresponding to each breakdown decreases. Even for the same dielectric material, the characteristic of the restart of the accumulated electrons varies with the state of the surface [13,23]. Therefore, our observed γ corresponds to the sum of the number of electrons restarting from CaO as accumulated electrons and the number of electrons emitted from the CaO bulk.…”
Section: Mechanism Underlying the Variation Of γmentioning
confidence: 87%
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“…Nevertheless, γ subsequently increases but the value of E/p 0 corresponding to each breakdown decreases. Even for the same dielectric material, the characteristic of the restart of the accumulated electrons varies with the state of the surface [13,23]. Therefore, our observed γ corresponds to the sum of the number of electrons restarting from CaO as accumulated electrons and the number of electrons emitted from the CaO bulk.…”
Section: Mechanism Underlying the Variation Of γmentioning
confidence: 87%
“…The experimental apparatus and procedure are briefly described here because they have already been reported [10,13]. An enlarged picture of the electrode system is shown in figure 1.…”
Section: Experimental Apparatus and Methodsmentioning
confidence: 99%
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“…We previously reported the secondary ionization coefficients for MgO, SrO and CaO film electrodes and the charge accumulated on them [9,23,24]. The results of the experiments suggested a positive correlation between the secondary ionization coefficient and the charge accumulated on a CaO film.…”
Section: Introductionmentioning
confidence: 95%
“…[40]. We are also investigating phenomena related to the accumulation of electrons on a dielectric electrode [41][42][43].…”
Section: Formation Of Hexagonal Arrayed Patternmentioning
confidence: 99%