1991
DOI: 10.1063/1.347724
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of InP/In0.53Ga0.47As and In0.53Ga0.47As/In0.52Al0.48As heterojunction band offsets by x-ray photoemission spectroscopy

Abstract: X-ray photoemission spectroscopy (XPS) has been used to measure the valence-band offset ΔEv for the lattice-matched InP/ In0.53Ga0.47As and In0.53Ga0.47As/ In0.52Al0.48As heterojunction interfaces. The heterojunctions were formed by molecular-beam epitaxy. We obtain values of ΔEv (InP/In0.53Ga0.47As) =0.34 eV (ΔEc/ ΔEv=43/57) and ΔEv (In0.53Ga0.47As/ In0.52Al0.48As) =0.22 eV (ΔEc/ ΔEv =68/32) for the respective interfaces. By combining these measurements with available XPS ΔEv (InP/ In0.52Al0.48As) data we fin… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
6
0
2

Year Published

2010
2010
2023
2023

Publication Types

Select...
6
2
1

Relationship

0
9

Authors

Journals

citations
Cited by 62 publications
(8 citation statements)
references
References 33 publications
0
6
0
2
Order By: Relevance
“…The binding energy of the P-In bulk photoemission component is 128.9 AE 0.05 eV. As the binding energy of the P-In(2p 3/2 ) bulk component relative to the energy of the valence band maximum (E VBM ) of InP was reported to be 127.74 AE 0.03 eV, 33,34 the position of the surface Fermi level in the native-oxide-covered n-InP(100) can be calculated as E FS0 = E VBM + 1.16 eV. Therefore, the surface Fermi level lies below the conduction band minimum and thus the surface band bending can be estimated as 0.19 AE 0.05 eV.…”
Section: Resultsmentioning
confidence: 99%
“…The binding energy of the P-In bulk photoemission component is 128.9 AE 0.05 eV. As the binding energy of the P-In(2p 3/2 ) bulk component relative to the energy of the valence band maximum (E VBM ) of InP was reported to be 127.74 AE 0.03 eV, 33,34 the position of the surface Fermi level in the native-oxide-covered n-InP(100) can be calculated as E FS0 = E VBM + 1.16 eV. Therefore, the surface Fermi level lies below the conduction band minimum and thus the surface band bending can be estimated as 0.19 AE 0.05 eV.…”
Section: Resultsmentioning
confidence: 99%
“…The VBO of the CdS/CZTS interface was calculated by the Krauts formula, [31] as also shown in Figure 9b VBO ¼ ðE cl À E VB Þ absorber À ðE cl À E VB Þ buffer À ΔE cl (1) where E cl is the binding energy of a core level (Cu 2p or Zn 2p) in the absorber, E VB is the VBM of either the CZTS or CdS references measured by HAXPES, and ΔE cl is the energy difference between a core level in the absorber and a core level in the buffer measured for the CdS/CZTS samples. The first two terms give the relative binding energy difference between a core level and the VB in the absorber and buffer references, respectively.…”
Section: Electronic Structure Of the Buffer/absorber Interfacementioning
confidence: 99%
“…The discontinuity in this reference potential across the heterostructure interface is defined as ∆V step . The valence 9 . f From Ref.…”
Section: Algaas Gaasmentioning
confidence: 99%