Abstract:X-ray photoemission spectroscopy (XPS) has been used to measure the valence-band offset ΔEv for the lattice-matched InP/ In0.53Ga0.47As and In0.53Ga0.47As/ In0.52Al0.48As heterojunction interfaces. The heterojunctions were formed by molecular-beam epitaxy. We obtain values of ΔEv (InP/In0.53Ga0.47As) =0.34 eV (ΔEc/ ΔEv=43/57) and ΔEv (In0.53Ga0.47As/ In0.52Al0.48As) =0.22 eV (ΔEc/ ΔEv =68/32) for the respective interfaces. By combining these measurements with available XPS ΔEv (InP/ In0.52Al0.48As) data we fin… Show more
“…The binding energy of the P-In bulk photoemission component is 128.9 AE 0.05 eV. As the binding energy of the P-In(2p 3/2 ) bulk component relative to the energy of the valence band maximum (E VBM ) of InP was reported to be 127.74 AE 0.03 eV, 33,34 the position of the surface Fermi level in the native-oxide-covered n-InP(100) can be calculated as E FS0 = E VBM + 1.16 eV. Therefore, the surface Fermi level lies below the conduction band minimum and thus the surface band bending can be estimated as 0.19 AE 0.05 eV.…”