Measurement of inductance and capacitance over nine decades

Avinor, M.; Hasson, A.

doi:10.1088/0022-3735/10/8/005

Cited by 1 publication

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“…The self-and mutual inductances can be determined by standard techniques. 25 To determine C 2 we soldered commercial high precision capacitors into the otherwise characterized circuit and measured the resonance frequency ω res of the rf oscillator. In Fig.…”

Section: A Unperturbed Rf-oscillatormentioning

confidence: 99%

Low-temperature and high magnetic field dynamic scanning capacitance microscope

Baumgärtner

Suddards

Mellor

2009

Review of Scientific Instruments

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We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures, and high magnetic fields. The setup is based on a noncontact atomic force microscope (AFM) with a quartz tuning fork sensor for the nonoptical excitation and readout in topography, force, and dissipation measurements. The metallic AFM tip forms part of a rf resonator with a transmission characteristics modulated by the sample properties and the tip-sample capacitance. The tip motion gives rise to a modulation of the capacitance at the frequency of the AFM sensor and its harmonics, which can be recorded simultaneously with the AFM data. We use an intuitive model to describe and analyze the resonator transmission and show that for most experimental conditions it is proportional to the complex tip-sample conductance, which depends on both the tip-sample capacitance and the sample resistivity. We demonstrate the performance of the DSCM on metal disks buried under a polymer layer and we discuss images recorded on a two-dimensional electron gas in the quantum Hall effect regime, i.e. at cryogenic temperatures and in high magnetic fields, where we directly image the formation of compressible stripes at the physical edge of the sample.

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Section: A Unperturbed Rf-oscillatormentioning

confidence: 99%