2006 IEEE International Symposium on Industrial Electronics 2006
DOI: 10.1109/isie.2006.296048
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of Frequency Dependent Dielectric Properties by the Capacitance Technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
1
0

Year Published

2010
2010
2018
2018

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 1 publication
0
1
0
Order By: Relevance
“…The possibility to represent the experimental data with dielectric relaxation models is discussed in several papers, e.g. using the Debye model [7], polyphase relaxation systems [2] and other models [8].…”
Section: Phenomena Of Dielectric Relaxation In Nanocompositesmentioning
confidence: 99%
See 1 more Smart Citation
“…The possibility to represent the experimental data with dielectric relaxation models is discussed in several papers, e.g. using the Debye model [7], polyphase relaxation systems [2] and other models [8].…”
Section: Phenomena Of Dielectric Relaxation In Nanocompositesmentioning
confidence: 99%
“…This paper focuses on two models of dielectric relaxation -models of Debye and Havriliak-Negami [8,9,10]. The choice of the particular models was determined by two factors: the flexibility in shaping the synthesized frequency curves over a wide frequency range, and a compact form of model description, comprising only a few arguments.…”
Section: Phenomena Of Dielectric Relaxation In Nanocompositesmentioning
confidence: 99%
“…Continuation of the study relates to thickness measurement with compensation both -the test item's displacement (surface roughness) and its dielectric permeability variation. Mathematical modelling of the unilateral capacitance probe was carried out in order to validate metrological parameters of CDF technique applied for this particular testing assignment [7]. The probe comprises a number of electrodes deployed on surface of the test item represented as a three layer structure.…”
Section: Basics Of Multidimensional Testingmentioning
confidence: 99%