2024
DOI: 10.1016/j.chip.2024.100097
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Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon

Mathieu de Kruijf,
Grayson M. Noah,
Alberto Gomez-Saiz
et al.
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“…While traditional current-based thermometry methods offer reliable cryogenic temperature probing, they have limited bandwidth due to small tunnelling currents. In contrast, RF reflectometry, with its high bandwidth capabilities exceeding 1 MHz and compatibility with microwave drive , and light illumination, has emerged as a standard electrical-readout technique for semiconductor quantum electronic devices. Due to these prospects, RF-reflectometry-based thermometry has been demonstrated across various device types, and a proof-of-concept thermodynamic study was carried out with observations yet to be fully understood . However, improvements in temperature sensitivity are still needed by addressing measurement noise …”
mentioning
confidence: 99%
“…While traditional current-based thermometry methods offer reliable cryogenic temperature probing, they have limited bandwidth due to small tunnelling currents. In contrast, RF reflectometry, with its high bandwidth capabilities exceeding 1 MHz and compatibility with microwave drive , and light illumination, has emerged as a standard electrical-readout technique for semiconductor quantum electronic devices. Due to these prospects, RF-reflectometry-based thermometry has been demonstrated across various device types, and a proof-of-concept thermodynamic study was carried out with observations yet to be fully understood . However, improvements in temperature sensitivity are still needed by addressing measurement noise …”
mentioning
confidence: 99%