Measurement-based large-signal simulation of active components from automated nonlinear vector network analyzer data via X-parameters

Horn, Jason; Gunyan, D.; Betts, Loren; Gillease, Chad; Verspecht, Jan; Root, David E.

doi:10.1109/comcas.2008.4562819

Cited by 21 publications

(8 citation statements)

References 7 publications

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“…However, simulations within the CAD environment require device models that accurately describe the device's non-linear behavior. Current trends in non-linear modeling of transistor behavior utilize measurement databases collected under representative system conditions such as bias, frequency and input drive [5]- [8]. The range of these measurement operating conditions dictates the size of the database, which thenceforth can be used in a direct wave look up table approach [6], be contained within descriptive functions i.e.…”

Section: Introductionmentioning

confidence: 99%

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Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band

Bell

Saini

Woodington

et al. 2011

2011 IEEE MTT-S International Microwave Symposium

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Recently there has been a renewed interest in improving power amplifier performance via input waveform engineering. In order to support this development it is important that non-linear behavioral device models can accurately describe and fully account for the high levels of input harmonic signal injection necessary. The work presented in this paper introduces an adapted mixing model formulation, which was used to extract input second harmonic model coefficients from a set of simultaneous active fundamental load-pull and harmonic sourcepull measurements at 9 GHz. It was observed that a fourth order model was sufficient to capture the response of the scattered travelling b 2,1 and b 2,2 waves to a confidence of 99.46% and 97.62% respectively of the measured data. Hereafter the behavioral model was used to accurately generate the full fundamental output impedance space and the respective port current and voltage waveforms within a CAD environment.

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Section: Introductionmentioning

confidence: 99%

“…The range of these measurement operating conditions dictates the size of the database, which thenceforth can be used in a direct wave look up table approach [6], be contained within descriptive functions i.e. S-functions or X-parameters [7] and [8].…”

Section: Introductionmentioning

confidence: 99%

Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band

Bell

Saini

Woodington

et al. 2011

2011 IEEE MTT-S International Microwave Symposium

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show abstract

“…The measured results can then be converted into time-domain waveforms or used for further simulation and design. The related work has been published in [4][5][6]. A simplified representation of the NVNA and its interoperability with ADS is shown in Figure 1.…”

Section: Introductionmentioning

confidence: 99%

X‐Parameter Measurement of Pulse‐Compression Nonlinear Transmission Lines

Amaya

Harrison

et al. 2009

Journal of Electrical and Computer Engineering

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X-parameters provide a powerful and eminently practical solution for interoperable measurement, modeling, and simulation of nonlinear microwave and RF components. Using X-parameters to do large-signal measurements has been brought into the spotlight. This paper introduces a new X-parameter application: measuring large-signal behaviour of pulse-compression nonlinear transmission lines (NLTLs). A specially configured Nonlinear Vector Network Analyzer (NVNA) was used to measure the Xparameters in the frequency-domain, and then the measured data was transformed into a nonlinear time-domain waveform. The results show both rise-time and fall-time reduction (double-edge compression) as expected and indicate that this newly developed X-parameter method implemented with an NVNA could correctly predict NLTLs' pulse-compression performance.

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“…Since X-parameters include many cross-frequency dependencies, there are more X-parameters than S-parameters. More information on X-parameters and the related large-signal testing are available in references [72], [73], and [74], 132…”

Section: (B) Koolen 'S One-step De-embedding Methodsmentioning

confidence: 99%

“…The related work has been published in[72,73,74],Since nonlinear VNAs such as the Agilent N5242A are now available, large-signal nonlinearity testing has become more feasible and convenient. The nonlinear VNA can not only measure harmonic amplitudes and phases but also harmonic phase coupling information.98Some of the conventional small-signal measurements for the pulse-compression NLTLs have been carried out at a laboratory of the Communications Research Centre (CRC), Ottawa.…”

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confidence: 99%

All-silicon CMOS pulse-compression nonlinear transmission lines

Li¹

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Measurement-based large-signal simulation of active components from automated nonlinear vector network analyzer data via X-parameters

Cited by 21 publications

References 7 publications

Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band

Behavioral model analysis using simultaneous active fundamental load-pull and harmonic source-pull measurements at X-band

X‐Parameter Measurement of Pulse‐Compression Nonlinear Transmission Lines

All-silicon CMOS pulse-compression nonlinear transmission lines

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