Measurement and optimization of clock-induced charge in electron multiplying charge-coupled devices

Bush, Nathan; Heymes, Julian; Hall, D.; Holland, Andrew D.; Jordan, D. M.

doi:10.1117/1.jatis.7.1.016002

Cited by 6 publications

(3 citation statements)

References 12 publications

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“…However, in practice, an EMCCD has a noise source called CIC that is added to every exposure, 3 , 12 where an extra charge is added during clocking of the charge-coupled pixels. CIC has been measured as low as 7×10−4 e−/pixel/readout, 13 while achieving is 5×10−3 e−/pixel/readout is relatively easy.…”

Section: Optimal Exposure Timementioning

confidence: 99%

Statistics of electron-multiplying charge-coupled devices

Sutin

2023

J. Astron. Telesc. Instrum. Syst.

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Electron-multiplying charge-coupled devices are efficient imaging devices for lowsurface-brightness ultraviolet astronomy from space. The large amplification allows photon counting (PC), the detection of events versus nonevents. This paper provides the statistics of the observation process, the photon-counting process, the amplification process, and the compression. The expression for the signal-to-noise of PC is written in terms of the polygamma function. The optimal exposure time is a function of the clock-induced charge. The exact distribution of amplification process is a simple-to-compute powered matrix. The optimal cutoff for comparing to the read noise is close to a strong function of the read noise and a weak function of the electron-multiplying gain and photon rate. A formula gives the expected compression rate.

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Section: Optimal Exposure Timementioning

confidence: 99%

Statistics of electron-multiplying charge-coupled devices

Sutin

2023

J. Astron. Telesc. Instrum. Syst.

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“…It can be noted that the strong electric field is also present at the top of the CDTI, where the p+ pinning layer is located. We can therefore reasonably think that this device is also affected by the clock-induced charge (CIC), with the latter being linked to the multiplication of holes under the effect of the strong electric field [24].…”

Section: Measurementsmentioning

confidence: 99%

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging

Marcelot,

Morvan,

Salih Alj

et al. 2023

Sensors

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This paper presents an electron multiplication charge coupled device (EMCCD) based on capacitive deep trench isolation (CDTI) and developed using complementary metal oxide semiconductor (CMOS) technology. The CDTI transfer register offers a charge transfer inefficiency lower than 10−4 and a low dark current o 0.11nA/cm2 at room temperature. In this work, the timing diagram is adapted to use this CDTI transfer register in an electron multiplication mode. The results highlight some limitations of this device in such an EM configuration: for instance, an unexpected increase in the dark current is observed. A design modification is then proposed to overcome these limitations and rely on the addition of an electrode on the top of the register. Thus, this new device preserves the good transfer performance of the register while adding an electron multiplication function. Technology computer-aided design (TCAD) simulations in 2D and 3D are performed with this new design and reveal a very promising structure.

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“…CGI work for the CCD201-20 has led to the development of the CCD311, which includes modifications to the CCD201-20 design to improve radiation hardness. These include narrowed charge collection channels to reduce charge transfer inefficiency (CTI) susceptibility and overspill drains to protect the gain register 3 . These sensors are under development specifically for NGRST, therefore there are some concerns about their availability.…”

Section: Sensor Candidatesmentioning

confidence: 99%

Evaluation of sensors for the detection of energy resolved very soft x-ray fluorescence

Jones¹,

Crews²,

Soman

et al. 2022

X-Ray, Optical, and Infrared Detectors for Astronomy X

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Energy-dispersive imaging spectroscopy of X-ray emission from the Earth's aurorae promises to further knowledge in the field of aeronomy. Time-and spatially-resolved observations of fluorescence from the dominant atmospheric components require the detection of X-rays as soft as 390 eV with a resolution of no more than 100 eV at these energies. The Auroral X-ray Imaging Spectrometer (AXIS) instrument of the Disturbed and quiet time Ionosphere-thermosphere System at High Altitudes (DISHA) mission is expected to perform these observations. The baseline instrument design has suggested the use of an electron-multiplying charge-coupled device (EMCCD). The EMCCD's electron-multiplying register can reduce the effective readout noise and enable the detection of signals as small as a single photoelectron. For the detection of soft X-rays, however, the noise penalty from the EM register's stochastic process degrades energy resolution.Emerging CMOS image sensors (CIS), particularly the Teledyne e2v CIS221-X test device, with back illumination, full depletion (with 36 µm thickness), large pixel sizes (40 µm), and low readout noise (3 e-rms effective) are expected to achieve the required performance without the effects of the EM register. Simple models for X-ray event sensitivity, detectability, and resolution, indicate that candidate CIS equal or better EMCCD performance. Furthermore, CIS offer other advantages including lower power consumption, higher operating temperature, and increased radiation hardness. However, these sensors introduce other behaviors that may impact their apparent benefits, which initial experimental testing and analyses are working to understand.

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Measurement and optimization of clock-induced charge in electron multiplying charge-coupled devices

Abstract: The Open University's repository of research publications and other research outputs Measurement and optimization of clock-induced charge in electron multiplying charge-coupled devices

Cited by 6 publications

References 12 publications

Statistics of electron-multiplying charge-coupled devices

Statistics of electron-multiplying charge-coupled devices

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging

Evaluation of sensors for the detection of energy resolved very soft x-ray fluorescence

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