Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer

Xu, 张旭 Zhang; Fuquan, 吴福全 Wu; Xia, 张霞 Zhang; Dianzhong, 郝殿中 Hao; Limei, 亓丽梅 Qi

doi:10.3788/gzxb20103911.2025

光子学报

2010

DOI: 10.3788/gzxb20103911.2025

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Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer

张旭 Zhang Xu

吴福全 Wu Fuquan²,

张霞 Zhang Xia³

et al.

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Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer

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