2006
DOI: 10.1016/j.spmi.2006.09.025
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MBE growth of nitride-based photovoltaic intersubband detectors

Abstract: In this work, we present the plasma-assisted molecular-beam epitaxial growth of quantum well infrared photodetector (QWIP) structures, including the Si-doped GaN/AlN short-period superlattice of the active region, conductive AlGaN claddings and integration of the final device. The growth of Si-doped GaN/AlN multiple quantum well (QW) structures is optimized by controlling substrate temperature, metal excess and growth interruptions. Structural characterization confirms a reduction of the interface roughness to… Show more

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Cited by 7 publications
(4 citation statements)
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“…A III‐nitride photodetector covering the 1.33–1.91 μm range has been already proposed . This range overlaps the mentioned “forbidden gap” and covers part of the SWIR.…”
Section: Resultsmentioning
confidence: 98%
“…A III‐nitride photodetector covering the 1.33–1.91 μm range has been already proposed . This range overlaps the mentioned “forbidden gap” and covers part of the SWIR.…”
Section: Resultsmentioning
confidence: 98%
“…In this case, since the Al-N bond is significantly stronger than its Ga-N counterpart, the liberated Ga can diffuse on the surface and function as a surfactant to promote an organized assembly of the growing film. 14,15 The displaced Ga eventually evaporates from the growth front into the vacuum owing to its high vapor pressure at the deposition conditions of 10 À7 Torr and 700 C.…”
Section: Resultsmentioning
confidence: 99%
“…scans on symmetric 0002 reflection for two samples: one grown in N-rich growth conditions due to high growth temperature at 760 C, the other one at optimized growth conditions (T S ¼ 670 C), as well as values from literature. [24][25][26][27][28][29] It has to be noticed that crystalline quality as measured by HRXRD is strongly dependent on the quality of the substrate, the strain state and the growth method used.…”
Section: Influence Of Growth Temperaturementioning
confidence: 99%