Mathematical Modelling of Impulse Excitation of a Superwideband PEC Cone Antenna

Doroshenko, V. O.; Klimova, N. P.; Stognii, Nadiia P.; Kostyn, Yu. D.

doi:10.1109/caol46282.2019.9019509

Search citation statements

Order By: Relevance

Paper Sections

Select...

Prediction Of the Random Component Of The Development Model Of Manufacturing Defects Of The Surface Layer Of The Functional Subs1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2020

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…For monotonic processes, the type of the initial distribution in the first approximation is preserved for any other time sections [31][32].…”

Section: Prediction Of the Random Component Of The Development Model Of Manufacturing Defects Of The Surface Layer Of The Functional Subsmentioning

confidence: 99%

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Невлюдов

Omarov

Chala

2020

Eskişehir Technical University Journal of Science and Technology a - Applied Sciences and Engineering

View full text Add to dashboard Cite

A mathematical model of the development of manufacturing defects, with the prediction of the random component of the model in the substrates of functional components of MOEMS, which are made of semiconductors, in particular, silicon, are developed in the article. The main manufacturing defects that arise in the surface layer of the substrates of the MOEMS functional components taking into account the technological processes of their production and dynamic processes were used when developing the model. The developed mathematical model takes into account the occurrence of a random component of the model with its predictive ability. The possibility of such control is the basis for the development of the scientific direction of technology and equipment for the production of semiconductors, materials and electronic devices-defect engineering, based on the management and forecasting of defect formation processes.

show abstract

“…For monotonic processes, the type of the initial distribution in the first approximation is preserved for any other time sections [31][32].…”

Section: Prediction Of the Random Component Of The Development Model Of Manufacturing Defects Of The Surface Layer Of The Functional Subsmentioning

confidence: 99%

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Невлюдов

Omarov

Chala

2020

Eskişehir Technical University Journal of Science and Technology a - Applied Sciences and Engineering

View full text Add to dashboard Cite

show abstract

Mathematical Modelling of Impulse Excitation of a Superwideband PEC Cone Antenna

Cited by 1 publication

References 6 publications

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Mathematical Model of the Development of Manufacturing Defects in the Surface Layer of Substrates of Moems’ Functional Components

Contact Info

Product

Resources

About