2020 Ieee Vlsi Device Circuit and System (Vlsi Dcs) 2020
DOI: 10.1109/vlsidcs47293.2020.9179881
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Mathematical Modelling of Drain Current Enhancement in High-k FD MOSFET

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Cited by 3 publications
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“…Researchers from all across the globe are working towards developing innovative technologies with smaller size devices while ensuring higher performance and decreasing production expenses. 2 Short channel effect (SCE) causes performance loss and ultimately limit scaling as technological developments advance down to the nanometre region. Various kinds of MOSFET have been established with lesser dimensions and enhanced features to suppress the short channel effect.…”
mentioning
confidence: 99%
“…Researchers from all across the globe are working towards developing innovative technologies with smaller size devices while ensuring higher performance and decreasing production expenses. 2 Short channel effect (SCE) causes performance loss and ultimately limit scaling as technological developments advance down to the nanometre region. Various kinds of MOSFET have been established with lesser dimensions and enhanced features to suppress the short channel effect.…”
mentioning
confidence: 99%