Materials Characterization Techniques

Surface properties and characterization of metallic biomaterials

“…Conventionally, the infrared spectroscopy consists of an infrared radiation source, a monochromator, and a detector (Leng, 2008;Robinson et al, 2005). A Fourier transformation is applied to convert the obtained interferogram (a plot of signal intensity versus time) into the final infrared spectrum (a plot of wavenumber versus absorbance intensity or % transmittance) (Leng, 2008;Robinson et al, 2005;Zhang et al, 2008). The radiation passes through the sample and the monochromator, where the radiation is dispersed into its constituent wavelengths, and the wavelengths are processed one at a time.…”

“…The chemical bonding of elements can also be determined by XPS. Depending on the system design, the area of analysis varies from 10 to 200 mm (Zhang et al, 2008). The detection limit varies from 0.1 to 1.0 atom% (Wachtman, 1993;Zhang et al, 2008).…”

“…It provides information regarding the top 1e10 nm of the material surface. Depth profiling is a technique that is used in XPS for determining the elemental information in the subsurface of a material (Kibel, 1992;Leng, 2008;Zhang et al, 2008). Depending on the system design, the area of analysis varies from 10 to 200 mm (Zhang et al, 2008).…”

“…It provides 3D-like images of surface morphology at nanometer resolutions (Brandon and Kaplan, 1999;Leng, 2008;Ratner, 2004;Zhang et al, 2008). It provides 3D-like images of surface morphology at nanometer resolutions (Brandon and Kaplan, 1999;Leng, 2008;Ratner, 2004;Zhang et al, 2008).…”

“…In AFM analysis, when the probe is carefully brought close to the sample surface at a distance of few angstroms, the forces such as van der Waals, capillary, or electrostatic that are generated between the probe and sample surface deflect the cantilever (Leggett, 1997;Leng, 2008;Zhang et al, 2008). To maintain a constant force between the probe and sample surface, the piezoelectric scanner moves the sample up and down, so that the probe follows the contour of the material surface.…”