Within a few years, nanocrystal-based infrared devices
have achieved
significant progress and advancements, including high-quality imaging
systems. This raises the need to develop tools that can probe the
active material of the device in situ and in operando to gain a deeper
understanding of their operation beyond the overall response of the
device. Here, we investigate a short-wave infrared imager based on
HgTe nanocrystals with photoconductive operation, which now proposes
imaging at wavelengths beyond the traditional InGaAs technology. We
demonstrate that we can use photoemission microscopy to probe the
energy landscape of this imaging array. Finally, we further use the
high spatial resolution of the method to get access to the vectorial
distribution of the electric field.