Material dependent dielectric breakdown model

Arshak, K.; Guiney, Ivor; Forde, E.

doi:10.1016/j.commatsci.2007.08.020

Cited by 5 publications

(1 citation statement)

References 20 publications

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“…The simulation of dielectric breakdown was first addressed with the dielectric breakdown model (DBM) or diffusion limited aggregation model [Niemeyer et al 1984;Irurzun et al 2002;Arshak et al 2008]. The DBM is a stochastic method capable of reproducing the fractal patterns seen in the breakdown of various materials.…”

Section: Introductionmentioning

confidence: 99%

A dynamic electro-thermo-mechanical model of dielectric breakdown in solids using peridynamics

Wildman

Gazonas

2015

J. Mech. Mater. Struct.

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The electro-thermo-mechanical breakdown of dielectric solids is modeled using peridynamics to describe the brittle fracture of a material under high electric fields. A coupled electrostatic, elastodynamic, thermodynamic model is used wherein electrostatic forces are computed and applied to the mechanical model and temperature effects are included. Fracture is simulated using peridynamics, a reformulation of elasticity that incorporates material failure. Coupling occurs between the electrostatic and mechanical forces and also the electrical material properties: specifically, the Lorentz and Kelvin forces are used to couple the electrostatic fields to the stress fields, conductivity is treated as nonlinear and a function of temperature, and mechanical damage is used to alter the permittivity. Results demonstrate that the method is capable of reproducing branching breakdown patterns seen in experiments using a deterministic method.

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Section: Introductionmentioning

confidence: 99%

A dynamic electro-thermo-mechanical model of dielectric breakdown in solids using peridynamics

Wildman

Gazonas

2015

J. Mech. Mater. Struct.

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A dynamics prediction of nitromethane → methyl nitrite isomerization in external electric field

2016

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As a follow-up to our investigation into the effect of external electric field on the chemical bond strength, the effects of external electric field on the CH3NO2 → CH3ONO isomerization dynamics were investigated using the MP2/6-311++G(2d,p) and CCSD/6-311++G(2d,p) methods. The rate constants in the absence and presence of various field strengths were calculated. The results show that, when the field strength is larger than +0.0060 a.u. along the C-NO2 bond axis, the barriers of the isomerization are lower than the C-NO2 bond dissociation energies, leading to the preferences of the isomerization over the C-NO2 bond dissociation. In this case, the sensitivities are higher than that in no field. However, in the other fields, the C-NO2 bond scission is favored and the sensitivities are almost equal to that in no field. Several good linear correlations are found between the field strengths and the changes of the bond lengths or corresponding electron densities.

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Effect of Glass-Phase Design on the Dielectric Properties of PbO-SrO-Na2O-Nb2O5-SiO2 Glass–Ceramic

Zhou

Zhang

Tang

et al. 2015

Journal of Elec Materi

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Material dependent dielectric breakdown model

Cited by 5 publications

References 20 publications

A dynamic electro-thermo-mechanical model of dielectric breakdown in solids using peridynamics

A dynamic electro-thermo-mechanical model of dielectric breakdown in solids using peridynamics

A dynamics prediction of nitromethane → methyl nitrite isomerization in external electric field

Effect of Glass-Phase Design on the Dielectric Properties of PbO-SrO-Na2O-Nb2O5-SiO2 Glass–Ceramic

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