Material dependence of multiple-scattering effects associated with photoelectron and Auger electron diffraction along atomic chains

Aebischer, H. A.; Greber, Thomas; Osterwalder, Jürg; Kaduwela, A. P.; Friedman, D. J.; Herman, G. S.; Fadley, C. S.

doi:10.1016/0039-6028(90)90229-2

Cited by 46 publications

(17 citation statements)

References 7 publications

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“…Nevertheless, the signal is broader at lower kinetic energy, because the photoelectron scattering amplitudes become more isotropic. In the SSC calculation this enlargement is too prominent owing to the absence of defocusing [12]. At the diffractogram center, the intensity modulation (E) in Fig.…”

Section: Resultsmentioning

confidence: 99%

“…In the above-mentioned energy range, the photoelectron inelastic mean free path (k) is large and thus the number of scattering events can be also large. The scattering on the first few atoms has a tendency to focus the emission in the emitterscatterer direction while on the subsequent atoms it tends to defocus the signal [12]. It is a clear indication for the necessity to use MSC in order to get precise information on the intensity and shape of the ''forward focusing'' peaks.…”

Section: Experimental and Computational Detailsmentioning

confidence: 99%

“…It is a clear indication for the necessity to use MSC in order to get precise information on the intensity and shape of the ''forward focusing'' peaks. Furthermore, the defocusing is also linked to the development of the conventional Kikuchi bands which become more intense when the forward-scattering peak intensity diminishes [12]. Thus MSC is also required to reproduce Kikuchi band intensities as well as diffraction pattern structure details.…”

Section: Experimental and Computational Detailsmentioning

confidence: 99%

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X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation

et al. 2006

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Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.

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Section: Resultsmentioning

confidence: 99%

Section: Experimental and Computational Detailsmentioning

confidence: 99%

Section: Experimental and Computational Detailsmentioning

confidence: 99%

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X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation

et al. 2006

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“…Also, we can note that the forward-focusing peak along the [001] direction is sharper than those of the C 1 and C 2 components. Considering the defocusing effects related to the multiple scattering events, such a narrowing is expected for electron emission from Mg atoms located beneath the oxide film 40,41 . This confirms that the C 0 component is associated with Auger electron emission from Mg atoms in the Ag substrate.…”

Section: Methodsmentioning

confidence: 99%

Induced work function changes at Mg-doped MgO/Ag(001) interfaces: Combined Auger electron diffraction and density functional study

et al. 2014

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The properties of MgO/Ag(001) ultrathin films with substitutional Mg atoms in the interface metal layer have been investigated by means of Auger electron diffraction experiments, ultraviolet photoemission spectroscopy, and density functional theory (DFT) calculations. Exploiting the layer-by-layer resolution of the Mg KL23L23 Auger spectra and using multiple scattering calculations we first determine the inter-layer distances as well as the morphological parameters of the MgO/Ag(001) system with and without Mg atoms incorporated at the interface. We find that the Mg atom incorporation drives a strong distortion of the interface layers and that its impact on the metal/oxide electronic structure is an important reduction of the work function (0.5 eV) related to band-offset variations at the interface. These experimental observations are in very good agreement with our DFT calculations which reproduce the induced lattice distortion and which reveal (through a Bader analysis) that the increase of the interface Mg concentration results in an electron transfer from Mg to Ag atoms of the metallic interface layer. Although the local lattice distortion appears as a consequence of the attractive (repulsive) Coulomb interaction between O 2− ions of the MgO interface layer and the nearest positively (negatively) charged Mg (Ag) neighbors of the metallic interface layer, its effect on the work function reduction is only limited. Finally, an analysis of the induced work function changes in terms of charge transfer, rumpling, and electrostatic compression contributions is attempted and reveals that the metal/oxide work function changes induced by interface Mg atoms incorporation are essentially driven by the increase of the electrostatic compression effect.

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“…7 (a) -(c), together with a corresponding simulation using single-scattering cluster theory [17]. All experimental patterns show the same diffraction features, which are furthermore well reproduced in the simulations apart from the well-known lack of feature-sharpening due to multiple-scattering effects [18].…”

Section: Resultsmentioning

confidence: 67%

Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer

Greif

Castiglioni

Becker‐Koch

et al. 2014

Journal of Electron Spectroscopy and Related Phenomena

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An efficient and fast way to measure photoelectron diffraction data over the full 2 angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(1 1 1) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. The sampling technique is extended to UV-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu (1 1 1 AbstractAn efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(111) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality.The sampling technique is extended to uv-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu(111).

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Material dependence of multiple-scattering effects associated with photoelectron and Auger electron diffraction along atomic chains

Cited by 46 publications

References 7 publications

X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation

X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation

Induced work function changes at Mg-doped MgO/Ag(001) interfaces: Combined Auger electron diffraction and density functional study

Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer

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