2017
DOI: 10.1016/j.nimb.2017.04.047
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Massive-scale molecular dynamics of ion-irradiated III–V compound semiconductors at the onset of nanopatterning

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Cited by 2 publications
(2 citation statements)
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“…Previous modeling work on GaN crystallization has focused on understanding CVD and molecular beam epitaxy processes, not solidification from the melt. , In addition, there has been no atomic-scale modeling of adatom diffusion on a substrate surface due to the limited force fields capable of modeling both the bulk/melt regions and adequately representing all the different phases and atom-types involved in the process. Even though there has been previous work studying the crystallization of liquid semiconductors and associated energy changes, the system was constrained to bulk phase solidification from liquid to crystal. Therefore, there remains a need to understand the reaction mechanism of additive manufacturing processes for semiconductors with an accurate and transferable force field capable of representing different phases.…”
Section: Introductionmentioning
confidence: 99%
“…Previous modeling work on GaN crystallization has focused on understanding CVD and molecular beam epitaxy processes, not solidification from the melt. , In addition, there has been no atomic-scale modeling of adatom diffusion on a substrate surface due to the limited force fields capable of modeling both the bulk/melt regions and adequately representing all the different phases and atom-types involved in the process. Even though there has been previous work studying the crystallization of liquid semiconductors and associated energy changes, the system was constrained to bulk phase solidification from liquid to crystal. Therefore, there remains a need to understand the reaction mechanism of additive manufacturing processes for semiconductors with an accurate and transferable force field capable of representing different phases.…”
Section: Introductionmentioning
confidence: 99%
“…Numerous previous studies on material doping and modification by using experimental methods and model simulations have shown that the collision cascade in damage generation is one of the most complex processes of defect physics [5][6][7][8][9]. Using a pulsed ion beam and fractal theory, Wallace et al systematically studied collision cascades in crystal silicon.…”
Section: Introductionmentioning
confidence: 99%