2015
DOI: 10.1007/s13361-015-1151-9
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Mass Spectrometry of Nanoparticles is Different

Abstract: Abstract. Secondary ion mass spectrometry, SIMS, is a method of choice for the characterization of nanoparticles, NPs. For NPs with large surface-to-volume ratios, heterogeneity is a concern. Assays should thus be on individual nano-objects rather than an ensemble of NPs; however, this may be difficult or impossible. This limitation can be side-stepped by probing a large number of dispersed NPs one-by-one and recording the emission from each NP separately. A large collection of NPs will likely contain subsets … Show more

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Cited by 11 publications
(6 citation statements)
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“…However, it is necessary to have a well-working methodology to deconvolute the analytical results. 202 Blanc et al used SIMS to analyse the composition of dielectric NPs localized in a silica glass matrix in the core of optical fibers. They performed SIMS imaging at high spatial resolution (NanoSIMS 50L) and their goal was to gain more understanding on the spectroscopic properties of the luminescent ions in these fibers.…”
Section: X-ray-based Techniquesmentioning
confidence: 99%
“…However, it is necessary to have a well-working methodology to deconvolute the analytical results. 202 Blanc et al used SIMS to analyse the composition of dielectric NPs localized in a silica glass matrix in the core of optical fibers. They performed SIMS imaging at high spatial resolution (NanoSIMS 50L) and their goal was to gain more understanding on the spectroscopic properties of the luminescent ions in these fibers.…”
Section: X-ray-based Techniquesmentioning
confidence: 99%
“…8 Growing awareness has led to a sharp increase in NP studies and development of methods for the measurement of NPs. 9 Methods such as atomic-force microscopy (AFM), 10 scanning electron microscopy (SEM), 11 secondary-ion mass spectrometry (SIMS), 12 transmission electron microscopy (TEM), dynamic light scattering (DLS), 13,14 and single particle–inductively coupled plasma mass spectrometry (SP-ICPMS) are frequently used to characterize NPs.…”
mentioning
confidence: 99%
“…It has been stated that "mass spectrometry of nanoparticles is different". 45 Indeed, for the type of objects examined here, the secondary ion emission is size-dependent and impacts are not all equivalent. Yet we demonstrate that NP-SIMS in the eventby-event bombardment/detection mode allows for accurate analysis of nanoassemblies.…”
Section: ■ Conclusionmentioning
confidence: 91%