Martensitic phase transformations and magnetocaloric effect in Al co-sputtered Ni–Mn–Sb alloy thin films

Akkera, Harish Sharma; Choudhary, Nitin; Kaur, Davinder

doi:10.1016/j.mseb.2015.04.007

Cited by 20 publications

(8 citation statements)

References 43 publications

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“…118 It has been shown that the choice of the substrate is very important because it influences the thin film growth, possibly leading to a stress-induced martensite or a preferential austenite phase at the interface. 111,[119][120][121][122] Several substrates have been used so far in the deposition of FSMA thin films, such as silicon (Si), 118,123 aluminum oxide (Al 2 O 3 ), 124 magnesium oxide (MgO), 111,120 strontium titanate (STO), 125 and Yttriastabilized zirconia (YSZ). 126 In the literature, the use of MgO(001) substrates is very common due to its low lattice mismatch with FSMA, enabling epitaxial growth (i.e., Ni-Mn based Heusler alloy thin films).…”

Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

“…130 With the aim of optimizing magnetic properties like MCE, several approaches have been undertaken, where doping is most common. Akkera et al 121 FSMA thin films leads to an increase in the martensitic transformation temperature. The authors established this correlation through temperature-dependent magnetization and resistance measurements and observed a higher DS max value of 23 mJ/(cm 3 K) at 300 K for a magnetic field change of DH 5 20 kOe that is associated with a large magnetovolume coupling.…”

Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

“…The authors established this correlation through temperature-dependent magnetization and resistance measurements and observed a higher DS max value of 23 mJ/(cm 3 K) at 300 K for a magnetic field change of DH 5 20 kOe that is associated with a large magnetovolume coupling. 121 Another work reported the study of different Ni-Co-Mn-Al thin film compositions deposited onto MgO(001) substrates and concluded that the structure of the martensite phase is 14 M and the metamagnetic martensite transformation occurs from the strongly FM austenite to the weakly magnetic martensite. 131 The Ni 41 Co 10.4 Mn 34.8 Al 13.8 films have shown an inverse GMCE with a peak value of DS max ; J/(kg K) for DH 5 50 kOe.…”

Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

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Magnetocaloric materials: From micro- to nanoscale

et al. 2018

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Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

Section: G Fm Shape Memory Alloysmentioning

confidence: 99%

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Magnetocaloric materials: From micro- to nanoscale

et al. 2018

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“…The martensitic transformation start temperature M s , martensitic transformation finish temperature M f , austenitic transformation start temperature A s and austenitic transformation finish temperature A f determined using the tangent method, and the Curie temperature T A C of the Ni 50 Mn 38 Sb 12 austenite determined from the tangent change at the highest step in the cooling curve, are summarized in Table 1. Compared with the transformation temperatures of the Ni-Mn-Sb alloys that have common or similar compositions, obtained by DSC, vibrating sample magnetometer (VSM) and the physical property measurement system (PPMS) in the literature (Barman & Kaur, 2015;Akkera et al, 2015;Sahoo et al, 2011;Feng et al, 2011;Rao et al, 2009;Aksoy et al, 2009;Du et al, 2007;Sutou et al, 2004), we find that the difference for each temperature in the present measurements is within AE30 K. This is mainly related to the change in composition, as for Ni-Mn-Sb alloys the transformation temperatures are very sensitive to the concentrations of the constituent elements. Different measurement approaches, like VSM and PPMS, could also have influences on the transformation temperatures and cause deviations.…”

Section: Resultsmentioning

confidence: 99%

Crystal structure and crystallographic characteristics of martensite in Ni₅₀Mn₃₈Sb₁₂ alloys

Zhang¹,

Yan²,

Zhang³

et al. 2016

J Appl Cryst

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For Ni-Mn-Sb ferromagnetic multifunctional alloys, the crystal structures of martensite variants and the orientation relationships between them are decisive factors for their magnetic field-induced behaviours and are hence of importance. Such information has rarely been reported in the literature. In the present work, the crystal structure, microstructure and orientation relationships of Ni-Mn-Sb martensite were thoroughly investigated by X-ray diffraction (XRD) and electron backscatter diffraction (EBSD). Through XRD analyses, the crystal structure of the martensite, including the crystal system, the space group, the lattice parameters and the atomic coordinates, was fully resolved. The structure is orthorhombic and can be represented with a 4O superstructure. EBSD analyses show that the Ni-Mn-Sb martensite has a lamellar form. One martensite lamella corresponds to one orientation variant. The lamellae are organized in long plate-shaped colonies. Within each colony, four distinct orientation variants (A, B, C and D) appear repeatedly and extend in roughly the same direction. The four variants are twin related to one another, with variants A and C (or variants B and D) forming a type I twin, variants A and B (or C and D) a type II twin, and variants A and D (or B and C) a compound twin. The complete twinning elements for each twin relation were thus fully determined. The interfaces between the variants were identified to be their corresponding twinning planes. All these results provide fundamental information for Ni-Mn-Sb alloys that is useful for interpreting their magnetic and mechanical characteristics.

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“…Os dispositivos eletrônicos de micro e nano escala modernos requerem técnicas de refrigeração em micro-escala, portanto, tem-se desenvolvido pesquisas investigando o EMC em filmes finos (2,3,4) . O efeito magnetocalórico de uma substância é caracterizado pela variação adiabática da temperatura e pela variação isotérmica da entropia magnética quando o material está sob a influência de um campo magnético variável.…”

Section: Introductionunclassified

Filmes de gadolínio depositados por magnetron sputtering sobre Si em diferentes potenciais de polarização

Alfaro¹,

Vieira²,

Sagás³

et al. 2016

RBAV

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ResumoFilmes finos de gadolínio (Gd) foram depositados em substratos de silício (Si) via triodo magnetron sputtering (TMS) com corrente constante de 0,5 A em atmosfera de argônio sob pressão de 0,4 Pa sem uso de aquecimento externo. Diferentes condições de deposição foram aplicadas ao substrato: potencial flutuante (1,1 V), polarização negativa (-15, -30 e -50 V), polarização positiva (5, 10 e 15 V) e substrato aterrado. Uma deposição com magnetron sputtering convencional também foi realizada em potencial flutuante (-16 V). As espessuras, medidas por perfilometria, foram da ordem de 0,9 μm. A estrutura cristalina e a morfologia dos filmes foram estudados por difração de raios-X (DRX) com ângulo rasante e microscopia de força atômica (MFA), respectivamente. Observou-se que a polarização positiva leva a uma corrente maior comparada a aplicação de uma polarização negativa. As imagens de MFA mostram que as superfícies dos filmes têm "grãos" alongados sem diferença significativa entre as amostras de diferentes polarizações. Os espectros de DRX apresentaram as mesmas características para todos os filmes. Portanto, as diferentes polarizações não causam mudanças significativas na morfologia e cristalinidade dos filmes. Medidas das propriedades elétricas como resistividade, concentração de portadores, mobilidade eletrônica e magnetorresistência pela técnica de van der Pauw apresentaram resultados ligeiramente distintos para cada polarização. The film thicknesses, measured by profilometry, were close to 0.9 μm. The crystalline structure and morphology of the films were analyzed by grazing incidence X-ray diffraction (GIXRD) and atomic force microscopy (AFM). When positive bias is applied to the substrate, a higher current was measured than for negative bias. The AFM images show that the film surface has elongated "grains". No significant difference in morphology was observed for the different bias. The XRD spectra present the same characteristics for all samples. Thus, the results showed that the bias has no significant effect on the surface morphology and crystallinity of the films. Measurements of the electrical properties such as resistivity, carrier concentration, mobility electronics and magnetoresistance by the technique of van der Pauw presented slightly different results for each polarization. Palavras-chave:

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Martensitic phase transformations and magnetocaloric effect in Al co-sputtered Ni–Mn–Sb alloy thin films

Cited by 20 publications

References 43 publications

Magnetocaloric materials: From micro- to nanoscale

Magnetocaloric materials: From micro- to nanoscale

Crystal structure and crystallographic characteristics of martensite in Ni₅₀Mn₃₈Sb₁₂ alloys

Filmes de gadolínio depositados por magnetron sputtering sobre Si em diferentes potenciais de polarização

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Martensitic phase transformations and magnetocaloric effect in Al co-sputtered Ni–Mn–Sb alloy thin films

Cited by 20 publications

References 43 publications

Magnetocaloric materials: From micro- to nanoscale

Magnetocaloric materials: From micro- to nanoscale

Crystal structure and crystallographic characteristics of martensite in Ni50Mn38Sb12 alloys

Filmes de gadolínio depositados por magnetron sputtering sobre Si em diferentes potenciais de polarização

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Crystal structure and crystallographic characteristics of martensite in Ni₅₀Mn₃₈Sb₁₂ alloys