Marker-based registration error estimation in see-through AR applications
Lukas Jütte,
Alexander Poschke,
Ludger Overmeyer
Abstract:The precise overlay in see-through AR applications and the development of methods to calculate the registration error for such applications using an AR head-mounted display (HMD) present significant challenges. This difficulty arises primarily due to the absence of ground truth data (GTD) as the scene is partially hidden by view restrictions. Traditional approaches may require expensive setups, like cameras or laser scanners, to capture the hidden area and generate GTD. We propose an approach to calculate the … Show more
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