Novel Optical Systems, Methods, and Applications XXVI 2023
DOI: 10.1117/12.2676355
|View full text |Cite
|
Sign up to set email alerts
|

Marker-based registration error estimation in see-through AR applications

Lukas Jütte,
Alexander Poschke,
Ludger Overmeyer

Abstract: The precise overlay in see-through AR applications and the development of methods to calculate the registration error for such applications using an AR head-mounted display (HMD) present significant challenges. This difficulty arises primarily due to the absence of ground truth data (GTD) as the scene is partially hidden by view restrictions. Traditional approaches may require expensive setups, like cameras or laser scanners, to capture the hidden area and generate GTD. We propose an approach to calculate the … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 27 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?