We further describe a protocol for the investigation of surface charge with scanning ion conductance microscopy. The protocol measures current-voltage curves at positions close to and far from the surface of interest and reports the differential response. The data can be interpreted in terms of rectification ratios, an intuitive quantity for such studies. With this protocol, we further investigate the effect of electrolyte concentration and study the influence of scan potential on surface charge measurement on chemically modified surfaces.Charge is a fundamental interfacial property that governs physical and chemical interactions at surfaces. The workings of catalysts, [1] sensors, [2] separation devices, [3] biological interfaces, [4] and colloidal systems, [5] are well known to be strongly influenced by surface charge, typically present in the form of protonated or deprotonated chemical moieties. Directly measuring charge in situ, especially for small (micro/nanoscale), heterogenous charge distributions presents an interesting and important challenge for electroanalytical chemistry. Here, we communicate studies in mapping interfacial charge with scanning ion conductance microscopy (SICM) [6][7][8] and the influence of electrolyte concentration on the charge sensing mechanism.When immersed in electrolyte, a charged substrate attracts counter ions and forms an electrical double layer (EDL), a key process in the consideration of nearly all electrochemical systems. With SICM, a small pipette, typically made of quartz or borosilicate, is brought near a surface of interest. The pipette is filled with electrolyte and an electrode (Ag/AgCl, WE) is placed inside the pipette, with a second electrode (RE) placed in the electrolyte solution (bath) surrounding the pipette and surface. Application of a potential between these two electrodes generates an ion current, with the dimensions of the pipette tip serving as a resistive element to the ion current. As the tip of the pipette is moved towards the surface, a distance dependent access resistance (R ac ) develops. With proper feedback methods, R ac can be used to control the vertical position of the pipette. If the tip of the pipette is small (e. g. a nanopipette), then the feedback regime occurs at distances where the EDL of the tip and the surface interact (typically on the order of the radius of the pipette opening), [9] and this interaction forms the basis for measuring or detecting the charge presented at the surface, as reflected in the EDL.Interactions between the ion current flowing through the tip of the nanopipette and the charge of a surface have been reported previously by our group [10][11][12] and others, [13][14][15][16][17][18][19][20] with charge mapping initially reported by Unwin and coworkers. [13] Charge mapping has been applied to chemically modified surfaces, [15] cell interfaces, [14,[16][17] chromosomes, [18] and supported lipid bilayers. [19,21] In previous studies, phase [13,15,17] or changes in apparent imaging height [19,21] have been used to in...