We study the strain dependence of the magnetic anisotropy of room-temperature ferromagnetic semiconductor (Ga 1-x ,Fe x)Sb (x = 20%) thin films epitaxially grown on different buffer layers, using ferromagnetic resonance measurements. We show that the magnetocrystalline anisotropy (K i) in (Ga 1-x ,Fe x)Sb exhibits a dependence on the epitaxial strain and changes its sign from negative (in-plane magnetization easy axis) to positive (perpendicular magnetization easy axis), when the strain is changed from tensile to compressive. Meanwhile, the shape anisotropy (K sh) is negative and dominant over K i. Therefore, the effective magnetic anisotropy (K eff = K i + K sh) is always negative, leading to the in-plane magnetic anisotropy in all the (Ga 1-x ,Fe x)Sb samples. This work is the first observation of ferromagnetic resonance and strong shape anisotropy at room temperature in III-V ferromagnetic semiconductors. We also observed very high Curie temperature (T C ≳ 400 K) in p-type (Ga,Fe)Sb, which is the highest T C reported so far in III-V based ferromagnetic semiconductors.