Many-hit model calculations for track etch rate in CR-39 SSNTD using confocal microscope data

Digital holographic microscopy for recording and analysis of 3D images of etched tracks in LR-115 SSNTD

“…The bulk etch rate (V B ) is relatively easy to measure by direct and indirect methods, but information on the track etch rate (V T ) is relatively scarce and very scattered. Since DHM allows the 3D visualizing of etched tracks with good accuracy, track etch rates can be determined by the time dependent track length method [33,34] or by the 3D-track wall method [35]. For the last case, track wall coordinates should be extracted from reproduced 3D track images by means of image analysis and computer calculations.…”

The Bragg-peak studies in CR-39 SSNTD on the basis of many-hit model for track etch rates

“…That is why their longitudinal co-ordinate s differs from the depth co-ordinate x of the detector. The longitudinal co-ordinate of energy loss maximum s max does not coincide with the depth at which V T becomes maximum, x max (Fromm et al, 2004). The REL were corrected by individual shifts along the depth in order to achieve a maximal coincidence between V T and REL as explained before.…”

“…It is shown that there is a possibility to use the many-hit theory of track structure for calculating the V T functions (Awad, 2003) for various ions with different energies whose tracks are etchable in CR-39. Available confocal microscope data are also investigated using LET as the zero-approximation in the framework of the many-hit model (Fromm et al, 2004). The analysis in the previous work was split into two separate parts.…”

Interpretation of the bulk etching process in LR-115 detectors by the many-hit model

“…More refined models are necessary for a correct description of the interaction between the physical process of diffusion and the kinetics of chemical reaction. A fundamental introduction to the basic ideas of the many-hit model (MHM) (Fromm et al, 2004) can be found in several relevant papers published by Ditlov (2005).…”

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The formalism of the many-hit model (MHM) [Fromm, M., Awad, E.M., Ditlov, V.A., 2004. Many-hit model calculation for track etch rate in CR-39 SSNTD using confocal microscope data.

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