Manipulation of magnetic properties of ferromagnetic Ni thin films grown on Cu(001) by antiferromagnetic NiO and effects of voltage application

Abstract

The magnetic properties of ferromagnetic Ni thin films grown on a Cu(001) single crystal are modified by the growth of a NiO overlayer, as well as by the voltage application through the NiO/Ni interface. A spin reorientation transition from in-plane to perpendicular magnetization is induced with increasing NiO thickness, and the coercive field significantly increases by further growth of the NiO overlayer. The remanent magnetization of the films is found to be modulated by the voltage application. Moreover, a small exchange-bias effect arising from the ferromagnetic–antiferromagnetic interaction at the interface is observed, and the amplitude of the effect is modified by the applied voltage.