Making carbon nanotube electron sources of defined lengths and with closed caps

Heeres, Erwin C; Oosterkamp, Tjerk H.; Jonge, Niels de

doi:10.1088/0957-4484/22/23/235308

Cited by 5 publications

(3 citation statements)

References 20 publications

(31 reference statements)

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“…Heeres et al used a similar method to produce MWCNT electron emitters, where water vapor was introduced into the chamber and cutting times were reported to be typically 1 min [40]. These nanotubes were reported to have open ends, which we expect to be case for the probes presented here.…”

Section: Cnt Attachmentmentioning

confidence: 83%

Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes

Slattery¹,

Blanch²,

Quinton³

et al. 2013

Nanotechnology

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Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applications, and a number of methods for fabricating these types of probe have been developed in recent years. This work reports the attachment of carbon nanotubes to AFM probes using a micromanipulator within a scanning electron microscope. Electron beam induced deposition and etching are used to enhance the quality and attachment of the carbon nanotube tip and improve the fabrication rate of the CNT AFM probes compared to existing techniques. The attachment process is also improved by using a mat of SWCNTs (buckypaper) as a CNT source, which simultaneously improves the ease of fabrication and rate of nanotube probe production. The aim of these improvements is to simplify and improve the attachment process such that these probes can be better and more widely used in applications that benefit from their unique properties. This improved process is then used to attach CNTs to the new generation of low-mass, high-frequency probes, which are designed for rapid AFM imaging. The ability of these probes to operate with CNT tips is demonstrated, and their wear-resistance properties were found to be significantly enhanced compared to unmodified probes. These wear-resistant probes imaging at high scan rates are proposed to be effective tools for increasing throughput in metrological analysis, particularly for imaging high-modulus surfaces with high roughness and high-aspect-ratio features.

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Section: Cnt Attachmentmentioning

confidence: 83%

Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes

Slattery¹,

Blanch²,

Quinton³

et al. 2013

Nanotechnology

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“…We have managed to repeatedly mount single MWNTs with their as-grown cap by pulling the entire MWNT without breaking it from its asgrown material. 10 In these experiments a long fine stage range is needed to be able to handle flexible nanotubes or nanowires. With the fine stage it is possible to manipulate micrometer-sized as-grown nanotubes and wires, without running out of range.…”

Section: Applicationsmentioning

confidence: 99%

A compact multipurpose nanomanipulator for use inside a scanning electron microscope

Heeres

Katan

et al. 2010

Review of Scientific Instruments

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A compact, two-stage nanomanipulator was designed and built for use inside a scanning electron microscope. It consists of a fine stage employing piezostacks that provide a 15 microm range in three dimensions and a coarse stage based on commercially available stick-slip motors. Besides the fabrication of enhanced probes for scanning probe microscopy and the enhancement of electron field emitters, other novel manipulation processes were developed, such as locating, picking up, and positioning small nanostructures with an accuracy of approximately 10 nm. In combination with in situ I-V experiments, welding, and etching, this results in a multipurpose nanofactory, enabling a new range of experiments.

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“…6 Despite these superior properties, the continuation towards a commercial product has proven to be difficult. The reasons for this could be that the inherent high aspect ratio of CNTs causes them to vibrate upon electron emission, which degrades the emission properties like the brightness 11 (unless they are shortened 11,12 ). Additionally, due to their nm size, CNTs are difficult to handle, which makes the process of mounting time-consuming and unreliable.…”

mentioning

confidence: 99%

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Knoop

Gatel

Houdellier

et al. 2015

Applied Physics Letters

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Making carbon nanotube electron sources of defined lengths and with closed caps

Cited by 5 publications

References 20 publications

Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes

Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes

A compact multipurpose nanomanipulator for use inside a scanning electron microscope

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

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