Major and Trace Element Determinations on Nist Glass Standard Reference Materials 611, 612, 614 and 1834 by Inductively Coupled Plasma‐mass Spectrometry

Abstract

We report on the major and trace element composition and homogeneity of NIST (National Institute of Standards and Technology) glass standard reference materials 611, 612, 614, and 1834 for use as microanalytical trace element standards in laser ablation‐inductively coupled plasma‐mass spectrometry. The four analyzed NIST glasses were not designed as microanalytical standards, but their availability and careful preparation made them obvious candidates. Our data indicate that NIST 1834 is inhomogeneous on a scale of 100 mg with respect to several trace elements. Within analytical uncertainty, NIST 611, 612, and 614 are apparently homogeneous.

Archaeometric investigation of Roman tesserae from Herculaneum (Italy) by the combined use of complementary micro-destructive analytical techniques

“…Ba investigated by means of different analytical methods, including ICP-MS (Hollocher and Ruiz, 1995;Kane, 1998;Pearce et al, 1997;Trejos et al, 2003;Walton et al, 2009), thus allowing evaluation of non-certified elements as well. The analytical results are reported in Table 1.…”

Elemental fractionation in laser ablation inductively coupled plasma mass spectrometry

“…Thus, each glass contains measurable concentrations of 65 of the 83 naturally occurring elements (those elements with half lives greater than several million years). While for geological analyses it is sometimes useful to prepare reference materials from rock powders, these generally have the disadvantage of having low concentrations of some analytes [11,12].…”

Chemical Characterisation of NIST Silicate Glass Certified Reference Material SRM 610 by ICP‐MS, TIMS, LIMS, SSMS, INAA, AAS and PIXE

“…Chaussidon and Libourel 1993, Hinton 1990, Kennedy et al 1993, Ottolini et al 1993, laser ablation ICP-MS (e.g. Accordingly, Hollocher and Ruiz (1995) showed that published trace element contents in SRM 610 are highly variable and may differ by more than 100 percent (e.g. However, despite the wide use of SRM 610 as a reference material (based mainly on the nominal concentration of all sixty one doped elements), certified concentrations (Reed 1992) are available for only eight elements (Fe, Mn, Ni, Rb, Sr, Pb, Th, U) .…”

“…These are compared to certified NIST values (Reed 1992) and published data (Hollocher and Ruiz 1995) in order to discuss the scale of possible chemical heterogeneities between different SRM 610 wafers. Comparative ion microprobe analysis has shown that the concentration of twenty one trace elements in our, and four other, SRM 610 wafers are identical within one percent .…”