Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration

Bassi, Ishaan; Ozev, Sule; Chang, Doohwang

doi:10.1109/vts50974.2021.9441000

2021 IEEE 39th VLSI Test Symposium (VTS) 2021

DOI: 10.1109/vts50974.2021.9441000

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Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration

Ishaan Bassi

Sule Ozev

Doohwang Chang

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Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration

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References 11 publications

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