Magnified hard x-ray microtomography: toward tomography with submicron resolution

To date, compound refractive X-ray lenses made out of Beryllium (Be CRLs) have been seldom applied for full-field microscopy with high spatial resolution, which was probably due to residual aberrations of these optics. However, in combination with the recent development of made-to-measure phase plates, the typical spherical aberration of beryllium compound refractive lenses (Be CRLs) can now be completely removed. In this way, distortion-free images of a sample are obtained, which is especially important for tomographic applications. First full-field imaging experiments with aberration-corrected Be CRLs were carried out at beamline P06 at the synchrotron radiation X-ray source PETRA III (DESY Hamburg, Germany). In order to maximize the magnification of the X-ray microscope for full-field microscopy, the full length of the beamline combining the micro-and nanohutch was utilized, enabling a large sample-to-detector distance. In this contribution, we present first imaging results, demonstrating the potential of Be CRLs for direct high-resolution X-ray tomography.

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“…In addition, software developments are required for the tomographic reconstuction taking into account absorption effects within the Be CRLs. 26…”

Section: Discussionmentioning

confidence: 99%

Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

Schropp

Brückner

Bulda

et al. 2019

X-Ray Nanoimaging: Instruments and Methods IV

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“…Fringes related to absorption in the objective are common artefacts in CRL-based microscopy [12]. The severity of the effect increases with decreasing effective objective aperture and with the distance from the sample feature to the optical axis.…”

Section: Fig 2: Illustration Of the Meaning Of Crl Parametersmentioning

confidence: 99%

Zernike phase contrast in high-energy x-ray transmission microscopy based on refractive optics

et al. 2018

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The current work represents the first implementation of Zernike phase contrast for compound refractive lens based x-ray microscopy, and also the first successful Zernike phase contrast experiment at photon energies above 12 keV. Phase contrast was achieved by fitting a compound refractive lens with a circular phase plate. The resolution is demonstrated to be sub-micron, and can be improved using already existing technology. The possibility of combining the technique with polychromatic radiation is considered, and a preliminary test experiment was performed with positive results.

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“…The advent of high brilliance third generation synchrotron radiation sources opened new fields for X-ray tomographic microscopy (XTM), (Bonse and Bush, 1996;Lee et al, 1997;Dowd et al, 1999;Weitkamp et al, 1999;Schroer, 2002b). Exploiting the high intensity and coherence of the source and combining X-ray microscopy with tomographic techniques, high resolution studies at sub-micrometer scale extending to higher energies (420 keV) while keeping very good efficiencies (490%) and short investigation times, became feasible.…”

Section: Introductionmentioning

confidence: 99%